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Daniel M. Sykora
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Middletown, CT, US
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Patents Grants
last 30 patents
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Patent Grant
In situ calibration of interferometers
Patent number
9,234,739
Issue date
Jan 12, 2016
Zygo Corporation
Daniel M. Sykora
G01 - MEASURING TESTING
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Patent Grant
In situ calibration of interferometers
Patent number
9,103,649
Issue date
Aug 11, 2015
Zygo Corporation
Daniel M. Sykora
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
IN SITU CALIBRATION OF INTERFEROMETERS
Publication number
20150055139
Publication date
Feb 26, 2015
Zygo Corporation
Daniel M. Sykora
G01 - MEASURING TESTING
Information
Patent Application
IN SITU CALIBRATION OF INTERFEROMETERS
Publication number
20130063730
Publication date
Mar 14, 2013
Zygo Corporation
Daniel M. Sykora
G01 - MEASURING TESTING