Daniel R. Fridline

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Coram, NY, US

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Patents Applicationslast 30 patents

Information Patent Application
IN-SITU OPTICAL CRACK MEASUREMENT USING A DOT PATTERN
- Publication number 20110106459
- Publication date May 5, 2011
- Northrop Grumman Corporation
- Robert J. Christ, JR.
- G01 - MEASURING TESTING