Daniel Reilly

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Chicago, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for measuring optical delay using a single photon...
- Patent number 9,696,412
- Issue date Jul 4, 2017
- Nucript LLC
- Gregory S. Kanter
- G01 - MEASURING TESTING
Information Patent Grant
Photonic assisted optical under-sampling with non-uniform sample in...
- Patent number 8,902,095
- Issue date Dec 2, 2014
- Nucript LLC
- Gregory S. Kanter
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Photonic assisted analog-to-digital conversion using phase detection
- Patent number 8,618,966
- Issue date Dec 31, 2013
- Nucript LLC
- Gregory S. Kanter
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
System and method for measuring optical delay using a single photon...
- Publication number 20160209498
- Publication date Jul 21, 2016
- Gregory S. KANTER
- G01 - MEASURING TESTING
Information Patent Application
Photonic assisted optical under-sampling with non- uniform sample i...
- Publication number 20130062508
- Publication date Mar 14, 2013
- Gregory S. Kanter
- G02 - OPTICS
Information Patent Application
Photonic assisted analog-to-digital conversion using phase detection
- Publication number 20120212360
- Publication date Aug 23, 2012
- Nucrypt LLC
- Gregory S. Kanter
- G02 - OPTICS