Daniel RHINOW

Person

Frankfurt am Main, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for examining a beam of charged particles
- Patent number 11,961,705
- Issue date Apr 16, 2024
- Carl Zeiss SMT GmbH
- Daniel Rhinow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for preparing a cross-linked hydrogel nanomembrane, the cros...
- Patent number 11,578,173
- Issue date Feb 14, 2023
- Quantifoil Micro Tools GmbH
- Andreas Terfort
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Functionalized nanomembrane, a method for preparation thereof and t...
- Patent number 10,794,908
- Issue date Oct 6, 2020
- Max-Planck-Gesellschaft zur Forderung der Wissenschaften E.V.
- Andreas Terfort
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MASK REPAIR
- Publication number 20240419065
- Publication date Dec 19, 2024
- Carl Zeisss SMT GmbH
- Christian Felix Hermanns
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COMPENSATION RASTER SCANNING
- Publication number 20240395492
- Publication date Nov 28, 2024
- Carl Zeiss SMT GMBH
- Daniel Rhinow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR ANALYSING AND/OR PROCESSING A SAMPLE WITH A PARTICLE...
- Publication number 20240210335
- Publication date Jun 27, 2024
- Carl Zeiss SMT GMBH
- Daniel Rhinow
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR REPAIRING A DEFECT OF A SAMPLE USING A FOC...
- Publication number 20240186109
- Publication date Jun 6, 2024
- Carl Zeiss SMT GMBH
- Nicole Auth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
END POINT DETERMINATION BY MEANS OF CONTRAST GAS
- Publication number 20230341766
- Publication date Oct 26, 2023
- Carl Zeiss SMT GMBH
- Daniel Rhinow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MASK REPAIR
- Publication number 20230305386
- Publication date Sep 28, 2023
- Carl Zeiss SMT GMBH
- Christian Felix Hermanns
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MASK REPAIR
- Publication number 20230280647
- Publication date Sep 7, 2023
- Carl Zeiss SMT GMBH
- Daniel Rhinow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR ANALYZING AND/OR PROCESSING A SAMPLE WITH A PARTICLE...
- Publication number 20230238213
- Publication date Jul 27, 2023
- Carl Zeiss SMT GMBH
- Ottmar Hoinkis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR PROCESSING A LITHOGRAPHIC MASK
- Publication number 20230113702
- Publication date Apr 13, 2023
- Carl Zeiss SMT GMBH
- Daniel Rhinow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SETTING A SIDE WALL ANGLE OF A PATTERN ELE...
- Publication number 20230109566
- Publication date Apr 6, 2023
- Carl Zeiss SMT GMBH
- Daniel Rhinow
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR EXAMINING A BEAM OF CHARGED PARTICLES
- Publication number 20210110996
- Publication date Apr 15, 2021
- Carl Zeiss SMT GMBH
- Daniel Rhinow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PREPARING A CROSS-LINKED HYDROGEL NANOMEMBRANE, THE CROS...
- Publication number 20200239642
- Publication date Jul 30, 2020
- Quantifoil Micro Tools GmbH
- Andreas TERFORT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FUNCTIONALIZED NANOMEMBRANE, A METHOD FOR PREPARATION THEREOF AND T...
- Publication number 20180017558
- Publication date Jan 18, 2018
- JOHANN WOLFGANG GOETHE-UNIVERSITAT
- Andreas TERFORT
- G01 - MEASURING TESTING

Daniel RHINOW

Person

Patents Grantslast 30 patents

Method and apparatus for examining a beam of charged particles

Method for preparing a cross-linked hydrogel nanomembrane, the cros...

Functionalized nanomembrane, a method for preparation thereof and t...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR MASK REPAIR

COMPENSATION RASTER SCANNING

APPARATUS FOR ANALYSING AND/OR PROCESSING A SAMPLE WITH A PARTICLE...

METHOD AND APPARATUS FOR REPAIRING A DEFECT OF A SAMPLE USING A FOC...

END POINT DETERMINATION BY MEANS OF CONTRAST GAS

METHOD AND APPARATUS FOR MASK REPAIR

METHOD AND APPARATUS FOR MASK REPAIR

APPARATUS FOR ANALYZING AND/OR PROCESSING A SAMPLE WITH A PARTICLE...

METHOD AND APPARATUS FOR PROCESSING A LITHOGRAPHIC MASK

METHOD AND APPARATUS FOR SETTING A SIDE WALL ANGLE OF A PATTERN ELE...

METHOD AND APPARATUS FOR EXAMINING A BEAM OF CHARGED PARTICLES

METHOD FOR PREPARING A CROSS-LINKED HYDROGEL NANOMEMBRANE, THE CROS...

FUNCTIONALIZED NANOMEMBRANE, A METHOD FOR PREPARATION THEREOF AND T...