Daniel Robert Burggraf III

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Richardson, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Testing for threshold voltage and bit cell current of non-volatile...
- Patent number 9,691,501
- Issue date Jun 27, 2017
- Texas Instruments Incorporated
- Trevor John Tarsi
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing of non-volatile memory arrays
- Patent number 9,142,321
- Issue date Sep 22, 2015
- Texas Instruments Incorporated
- Trevor John Tarsi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test isolation logic bank with separate test enable input
- Patent number 8,694,840
- Issue date Apr 8, 2014
- Texas Instruments Incorporated
- Daniel R. Burggraf
- G11 - INFORMATION STORAGE
Information Patent Grant
Isolation logic between non-volatile memory and test and wrapper co...
- Patent number 8,539,290
- Issue date Sep 17, 2013
- Texas Instruments Incorporated
- Daniel Robert Burggraf
- G11 - INFORMATION STORAGE
Information Patent Grant
On-chip memory testing
- Patent number 8,392,772
- Issue date Mar 5, 2013
- Texas Instruments Incorporated
- Daniel Robert Burggraf
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TESTING OF NON-VOLATILE MEMORY ARRAYS
- Publication number 20150357046
- Publication date Dec 10, 2015
- TEXAS INSTRUMENTS INCORPORATED
- TREVOR JOHN TARSI
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING OF NON-VOLATILE MEMORY ARRAYS
- Publication number 20150012787
- Publication date Jan 8, 2015
- TEXAS INSTRUMENTS INCORPORATED
- TREVOR JOHN TARSI
- G11 - INFORMATION STORAGE
Information Patent Application
ON-CHIP MEMORY TESTING
- Publication number 20130322176
- Publication date Dec 5, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Daniel R. Burggraf
- G11 - INFORMATION STORAGE
Information Patent Application
ON-CHIP MEMORY TESTING
- Publication number 20130148431
- Publication date Jun 13, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Daniel Robert Burggraf
- G11 - INFORMATION STORAGE