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Daniel S. Dwyer
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Auburn, NH, US
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Patents Grants
last 30 patents
Information
Patent Grant
Magnetic field sensors and related techniques that can communicate...
Patent number
9,222,990
Issue date
Dec 29, 2015
Allegro Microsystems, LLC
Daniel S. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensors and related techniques provide a self-test b...
Patent number
9,068,859
Issue date
Jun 30, 2015
Allegro Microsystems, LLC
Daniel S. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensors and related techniques that can provide a se...
Patent number
8,860,404
Issue date
Oct 14, 2014
Allegro Microsystems, LLC
Daniel S. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Circuits and methods for generating a threshold signal used in a ma...
Patent number
8,723,512
Issue date
May 13, 2014
Allegro Microsystems, LLC
Eric Burdette
G01 - MEASURING TESTING
Information
Patent Grant
Method for fabricating a magnet structure
Patent number
6,692,676
Issue date
Feb 17, 2004
Allegro Microsystems, Inc.
Ravi Vig
G01 - MEASURING TESTING
Information
Patent Grant
Magnet structure
Patent number
6,278,269
Issue date
Aug 21, 2001
Allegro Microsystems, Inc.
Ravi Vig
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CIRCUITS AND METHODS FOR GENERATING A THRESHOLD SIGNAL USED IN A MA...
Publication number
20140145711
Publication date
May 29, 2014
Eric Burdette
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Field Sensors And Related Techniques That Can Provide A Se...
Publication number
20130335068
Publication date
Dec 19, 2013
ALLEGRO MICROSYSTEMS, INC.
Daniel S. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Field Sensors And Related Techniques That Can Provide An O...
Publication number
20130335067
Publication date
Dec 19, 2013
ALLEGRO MICROSYSTEMS, INC.
Daniel S. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Field Sensors and Related Techniques That Can Provide Self...
Publication number
20130335074
Publication date
Dec 19, 2013
ALLEGRO MICROSYSTEMS, INC.
Daniel S. Dwyer
G01 - MEASURING TESTING