Daniel S. Fischer

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Wappingers Falls, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Pattern recognition with edge correction for design based metrology
- Patent number 8,495,527
- Issue date Jul 23, 2013
- International Business Machines Corporation
- Todd C. Bailey
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Pattern recognition with edge correction for design based metrology
- Patent number 8,429,570
- Issue date Apr 23, 2013
- International Business Machines Corporation
- Todd C. Bailey
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
Correcting and Optimizing Contours for Optical Proximity Correction...
- Publication number 20120192125
- Publication date Jul 26, 2012
- International Business Machines Corporation
- Daniel S. Fischer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Pattern Recognition with Edge Correction for Design Based Metrology
- Publication number 20120110522
- Publication date May 3, 2012
- International Business Machines Corporation
- Todd C. Bailey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN RECOGNITION WITH EDGE CORRECTION FOR DESIGN BASED METROLOGY
- Publication number 20120110523
- Publication date May 3, 2012
- International Business Machines Corporation
- Todd C. Bailey
- G06 - COMPUTING CALCULATING COUNTING