Daniel Scobee

Person

Ione, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Standalone thermal chamber for a temperature control component
- Patent number 11,808,803
- Issue date Nov 7, 2023
- Micron Technology, Inc.
- Daniel G. Scobee
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Thermal control component
- Patent number D995530
- Issue date Aug 15, 2023
- Micron Technology, Inc.
- Daniel G. Scobee
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Thermal chamber for a thermal control component
- Patent number 11,658,175
- Issue date May 23, 2023
- Micron Technology, Inc.
- Daniel G. Scobee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Standalone thermal chamber for a temperature control component
- Patent number 11,493,550
- Issue date Nov 8, 2022
- Micron Technology, Inc.
- Daniel G. Scobee
- G01 - MEASURING TESTING
Information Patent Grant
Thermal control component
- Patent number D954712
- Issue date Jun 14, 2022
- Micron Technology, Inc.
- Daniel G. Scobee
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Temperature control component for electronic systems
- Patent number 11,334,129
- Issue date May 17, 2022
- Micron Technology, Inc.
- Daniel G. Scobee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Management of test resources to perform testing of memory component...
- Patent number 11,257,565
- Issue date Feb 22, 2022
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermal chamber for a thermal control component
- Patent number 11,121,125
- Issue date Sep 14, 2021
- Micron Technology, Inc.
- Daniel G. Scobee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Performing a test of memory components with fault tolerance
- Patent number 11,043,269
- Issue date Jun 22, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G11 - INFORMATION STORAGE
Information Patent Grant
Management of test resources to perform reliability testing of memo...
- Patent number 10,910,081
- Issue date Feb 2, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermal control component
- Patent number D893484
- Issue date Aug 18, 2020
- Micron Technology, Inc.
- Daniel G. Scobee
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Performing a test of memory components with fault tolerance
- Patent number 10,672,470
- Issue date Jun 2, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
STANDALONE THERMAL CHAMBER FOR A TEMPERATURE CONTROL COMPONENT
- Publication number 20230046331
- Publication date Feb 16, 2023
- Micron Technology, Inc.
- Daniel G. Scobee
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CONTROL COMPONENT FOR ELECTRONIC SYSTEMS
- Publication number 20220244765
- Publication date Aug 4, 2022
- Micron Technology, Inc.
- Daniel G. SCOBEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THERMAL CHAMBER FOR A THERMAL CONTROL COMPONENT
- Publication number 20210391319
- Publication date Dec 16, 2021
- Micron Technology, Inc.
- Daniel G. Scobee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE CONTROL COMPONENT FOR ELECTRONIC SYSTEMS
- Publication number 20210181819
- Publication date Jun 17, 2021
- Micron Technology, Inc.
- Daniel G. SCOBEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STANDALONE THERMAL CHAMBER FOR A TEMPERATURE CONTROL COMPONENT
- Publication number 20210181249
- Publication date Jun 17, 2021
- Micron Technology, Inc.
- Daniel G. Scobee
- G01 - MEASURING TESTING
Information Patent Application
MANAGEMENT OF TEST RESOURCES TO PERFORM TESTING OF MEMORY COMPONENT...
- Publication number 20210134385
- Publication date May 6, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PERFORMING A TEST OF MEMORY COMPONENTS WITH FAULT TOLERANCE
- Publication number 20200294587
- Publication date Sep 17, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G11 - INFORMATION STORAGE
Information Patent Application
DUAL THERMOELECTRIC COMPONENT APPARATUS WITH THERMAL TRANSFER COMPO...
- Publication number 20200194650
- Publication date Jun 18, 2020
- Micron Technology, Inc.
- Daniel G. Scobee
- G01 - MEASURING TESTING
Information Patent Application
THERMAL CHAMBER FOR A THERMAL CONTROL COMPONENT
- Publication number 20200194420
- Publication date Jun 18, 2020
- Micron Technology, Inc.
- Daniel G. Scobee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANAGEMENT OF TEST RESOURCES TO PERFORM RELIABILITY TESTING OF MEMO...
- Publication number 20200194091
- Publication date Jun 18, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G11 - INFORMATION STORAGE
Information Patent Application
PERFORMING A TEST OF MEMORY COMPONENTS WITH FAULT TOLERANCE
- Publication number 20200176057
- Publication date Jun 4, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G11 - INFORMATION STORAGE

Daniel Scobee

Person

Patents Grantslast 30 patents

Standalone thermal chamber for a temperature control component

Thermal control component

Thermal chamber for a thermal control component

Standalone thermal chamber for a temperature control component

Thermal control component

Temperature control component for electronic systems

Management of test resources to perform testing of memory component...

Thermal chamber for a thermal control component

Performing a test of memory components with fault tolerance

Management of test resources to perform reliability testing of memo...

Thermal control component

Performing a test of memory components with fault tolerance

Patents Applicationslast 30 patents

STANDALONE THERMAL CHAMBER FOR A TEMPERATURE CONTROL COMPONENT

TEMPERATURE CONTROL COMPONENT FOR ELECTRONIC SYSTEMS

THERMAL CHAMBER FOR A THERMAL CONTROL COMPONENT

TEMPERATURE CONTROL COMPONENT FOR ELECTRONIC SYSTEMS

STANDALONE THERMAL CHAMBER FOR A TEMPERATURE CONTROL COMPONENT

MANAGEMENT OF TEST RESOURCES TO PERFORM TESTING OF MEMORY COMPONENT...

PERFORMING A TEST OF MEMORY COMPONENTS WITH FAULT TOLERANCE

DUAL THERMOELECTRIC COMPONENT APPARATUS WITH THERMAL TRANSFER COMPO...

THERMAL CHAMBER FOR A THERMAL CONTROL COMPONENT

MANAGEMENT OF TEST RESOURCES TO PERFORM RELIABILITY TESTING OF MEMO...

PERFORMING A TEST OF MEMORY COMPONENTS WITH FAULT TOLERANCE