Daniel Skiera

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Langgoens, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for inspection and detection of defects on surfaces of disc-...
- Patent number 8,705,837
- Issue date Apr 22, 2014
- KLA-Tencor MIE GmbH
- Detlef Michelsson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for optical inspection, detection and visualization of defec...
- Patent number 8,090,185
- Issue date Jan 3, 2012
- Vistec Semiconductor Systems GmbH
- Ralf Friedrich
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for optical inspection, detection and visualization of defec...
- Publication number 20090161097
- Publication date Jun 25, 2009
- Vistec Semiconductor Systems GmbH
- Ralf Friedrich
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING DEFECTS ON THE BACK SIDE OF A SEMICONDUCTOR WAFER
- Publication number 20080249728
- Publication date Oct 9, 2008
- Vistec Semiconductor Systems GmbH
- Detlef Michelsson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of determining geometric parameters of a wafer
- Publication number 20080208523
- Publication date Aug 28, 2008
- Vistec Semiconductor Systems GmbH
- Rene Schenck
- G01 - MEASURING TESTING