Daniel Smathers

Person

Boulder, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for transferring serialized test result data from...
- Patent number 9,739,834
- Issue date Aug 22, 2017
- Marvell International Ltd.
- Saeed Azimi
- G01 - MEASURING TESTING
Information Patent Grant
Serializer/deserializer and method for transferring data between an...
- Patent number 9,285,421
- Issue date Mar 15, 2016
- Marvell International Ltd.
- Saeed Azimi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for providing a test result from an integrated to...
- Patent number 8,977,921
- Issue date Mar 10, 2015
- Marvell International Ltd.
- Saeed Azimi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing an integrated circuit embedded in a s...
- Patent number 8,713,391
- Issue date Apr 29, 2014
- Marvell International Ltd.
- Saeed Azimi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing and debugging an integrated circuit
- Patent number 8,572,448
- Issue date Oct 29, 2013
- Marvell International Ltd.
- Saeed Azimi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing and debugging an integrated circuit
- Patent number 8,356,223
- Issue date Jan 15, 2013
- Marvell International Ltd.
- Saeed Azimi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing and debugging an integrated circuit
- Patent number 8,161,336
- Issue date Apr 17, 2012
- Marvell International Ltd.
- Saeed Azimi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing and debugging an integrated circuit
- Patent number 7,930,604
- Issue date Apr 19, 2011
- Marvell International Ltd.
- Saeed Azimi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing and debugging an integrated circuit
- Patent number 7,721,167
- Issue date May 18, 2010
- Marvell International Ltd
- Saeed Azimi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for testing and debugging an integrated circuit
- Patent number 7,590,911
- Issue date Sep 15, 2009
- Marvell International Ltd.
- Saeed Azimi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for testing and debugging an integrated circuit
- Patent number 7,496,812
- Issue date Feb 24, 2009
- Marvell International Ltd.
- Saeed Azimi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for testing and debugging an integrated circuit
- Patent number 7,496,818
- Issue date Feb 24, 2009
- Marvell International Ltd.
- Saeed Azimi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for testing and debugging an integrated circuit
- Patent number 7,444,571
- Issue date Oct 28, 2008
- Marvell International Ltd.
- Saeed Azimi
- G06 - COMPUTING CALCULATING COUNTING

Daniel Smathers

Person

Patents Grantslast 30 patents

System and method for transferring serialized test result data from...

Serializer/deserializer and method for transferring data between an...

System and method for providing a test result from an integrated to...

System and method for testing an integrated circuit embedded in a s...

Apparatus and method for testing and debugging an integrated circuit

Apparatus and method for testing and debugging an integrated circuit

Apparatus and method for testing and debugging an integrated circuit

Apparatus and method for testing and debugging an integrated circuit

Apparatus and method for testing and debugging an integrated circuit

Apparatus and method for testing and debugging an integrated circuit

Apparatus and method for testing and debugging an integrated circuit

Apparatus and method for testing and debugging an integrated circuit

Apparatus and method for testing and debugging an integrated circuit