Daniel T. Kennedy

Person

Burlington, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method of making semiconducting ferroelectric PTCR devices
- Patent number 5,316,973
- Issue date May 31, 1994
- GTE Control Devices Incorporated
- Da Y. Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for sensing nox
- Patent number 5,304,294
- Issue date Apr 19, 1994
- GTE Laboratories Incorporated
- Da Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
System of dielectric ceramic compositions suitable for microwave ap...
- Patent number 5,296,424
- Issue date Mar 22, 1994
- GTE Control Devices Incorporated
- Da Y. Wang
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Grant
PTCR device
- Patent number 5,281,845
- Issue date Jan 25, 1994
- GTE Control Devices Incorporated
- Da Y. Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining identification and concentration of an atmos...
- Patent number 5,221,445
- Issue date Jun 22, 1993
- GTE Laboratories Incorporated
- Da Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for sensing NOx
- Patent number 5,217,588
- Issue date Jun 8, 1993
- GTE Laboratories Incorporated
- Da Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for gaseous fuel cell operation
- Patent number 5,100,742
- Issue date Mar 31, 1992
- GTE Laboratories Incorporated
- Da Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining identification and concentration of an atmos...
- Patent number 5,080,765
- Issue date Jan 14, 1992
- GTE Laboratories Incorporated
- Da Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for sensing nitrous oxide
- Patent number 5,034,107
- Issue date Jul 23, 1991
- GTE Laboratories Incorporated
- Da Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Gas sensing apparatus
- Patent number 4,897,174
- Issue date Jan 30, 1990
- GTE Laboratories Incorporated
- Da Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method of making ohmic contact to ferroelectric semiconductors
- Patent number 4,895,812
- Issue date Jan 23, 1990
- GTE Laboratories Incorporated
- Da Y. Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas sensor element
- Patent number 4,880,519
- Issue date Nov 14, 1989
- GTE Laboratories Incorporated
- Da Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Gas analysis apparatus
- Patent number 4,547,281
- Issue date Oct 15, 1985
- GTE Laboratories Incorporated
- Da Y. Wang
- G01 - MEASURING TESTING

Daniel T. Kennedy

Person

Patents Grantslast 30 patents

Method of making semiconducting ferroelectric PTCR devices

Method and apparatus for sensing nox

System of dielectric ceramic compositions suitable for microwave ap...

PTCR device

Method for determining identification and concentration of an atmos...

Method and apparatus for sensing NOx

Method and device for gaseous fuel cell operation

Method for determining identification and concentration of an atmos...

Method for sensing nitrous oxide

Gas sensing apparatus

Method of making ohmic contact to ferroelectric semiconductors

Gas sensor element

Gas analysis apparatus