Daniel T. McCormick

Person

San Francisco, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Capacitive sensor housing for chamber condition monitoring
- Patent number 12,163,911
- Issue date Dec 10, 2024
- Applied Materials, Inc.
- Yaoling Pan
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive sensor for chamber condition monitoring
- Patent number 11,581,206
- Issue date Feb 14, 2023
- Applied Materials, Inc.
- Yaoling Pan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitive sensor housing for chamber condition monitoring
- Patent number 11,415,538
- Issue date Aug 16, 2022
- Applied Materials, Inc.
- Yaoling Pan
- G01 - MEASURING TESTING
Information Patent Grant
Wafer based corrosion and time dependent chemical effects
- Patent number 11,088,000
- Issue date Aug 10, 2021
- Applied Materials, Inc.
- Leonard Tedeschi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer processing equipment having capacitive micro sensors
- Patent number 10,923,405
- Issue date Feb 16, 2021
- Applied Materials, Inc.
- Leonard Tedeschi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer based corrosion and time dependent chemical effects
- Patent number 10,515,862
- Issue date Dec 24, 2019
- Applied Materials, Inc.
- Leonard Tedeschi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer processing equipment having capacitive micro sensors
- Patent number 10,083,883
- Issue date Sep 25, 2018
- Applied Materials, Inc.
- Leonard Tedeschi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer processing equipment having exposable sensing layers
- Patent number 9,975,758
- Issue date May 22, 2018
- Applied Materials, Inc.
- Leonard Tedeschi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Wafer processing equipment having exposable sensing layers
- Patent number 9,725,302
- Issue date Aug 8, 2017
- Applied Materials, Inc.
- Leonard Tedeschi
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
CAPACITIVE SENSOR HOUSING FOR CHAMBER CONDITION MONITORING
- Publication number 20220341867
- Publication date Oct 27, 2022
- Applied Materials, Inc.
- Yaoling Pan
- G01 - MEASURING TESTING
Information Patent Application
CAPACITIVE SENSOR HOUSING FOR CHAMBER CONDITION MONITORING
- Publication number 20210278360
- Publication date Sep 9, 2021
- Applied Materials, Inc.
- Yaoling Pan
- G01 - MEASURING TESTING
Information Patent Application
CAPACITIVE SENSOR FOR CHAMBER CONDITION MONITORING
- Publication number 20210280443
- Publication date Sep 9, 2021
- Applied Materials, Inc.
- Yaoling Pan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER BASED CORROSION & TIME DEPENDENT CHEMICAL EFFECTS
- Publication number 20200118896
- Publication date Apr 16, 2020
- Applied Materials, Inc.
- Leonard Tedeschi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER PROCESSING EQUIPMENT HAVING CAPACITIVE MICRO SENSORS
- Publication number 20180374764
- Publication date Dec 27, 2018
- Applied Materials, Inc.
- Leonard Tedeschi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER BASED CORROSION & TIME DEPENDENT CHEMICAL EFFECTS
- Publication number 20180294200
- Publication date Oct 11, 2018
- Applied Materials, Inc.
- Leonard TEDESCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER PROCESSING EQUIPMENT HAVING EXPOSABLE SENSING LAYERS
- Publication number 20180057356
- Publication date Mar 1, 2018
- Applied Materials, Inc.
- Leonard Tedeschi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
WAFER PROCESSING EQUIPMENT HAVING CAPACITIVE MICRO SENSORS
- Publication number 20170365531
- Publication date Dec 21, 2017
- Applied Materials, Inc.
- Leonard Tedeschi
- G01 - MEASURING TESTING

Daniel T. McCormick

Person

Patents Grantslast 30 patents

Capacitive sensor housing for chamber condition monitoring

Capacitive sensor for chamber condition monitoring

Capacitive sensor housing for chamber condition monitoring

Wafer based corrosion and time dependent chemical effects

Wafer processing equipment having capacitive micro sensors

Wafer based corrosion and time dependent chemical effects

Wafer processing equipment having capacitive micro sensors

Wafer processing equipment having exposable sensing layers

Wafer processing equipment having exposable sensing layers

Patents Applicationslast 30 patents

CAPACITIVE SENSOR HOUSING FOR CHAMBER CONDITION MONITORING

CAPACITIVE SENSOR HOUSING FOR CHAMBER CONDITION MONITORING

CAPACITIVE SENSOR FOR CHAMBER CONDITION MONITORING

WAFER BASED CORROSION & TIME DEPENDENT CHEMICAL EFFECTS

WAFER PROCESSING EQUIPMENT HAVING CAPACITIVE MICRO SENSORS

WAFER BASED CORROSION & TIME DEPENDENT CHEMICAL EFFECTS

WAFER PROCESSING EQUIPMENT HAVING EXPOSABLE SENSING LAYERS

WAFER PROCESSING EQUIPMENT HAVING CAPACITIVE MICRO SENSORS