Daniel TILLE

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Unterhaching, DE

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Patents Grantslast 30 patents

Information Patent Grant
Integrated test circuit, test assembly and method for testing an in...
- Patent number 12,055,587
- Issue date Aug 6, 2024
- Infineon Technologies AG
- Tobias Kilian
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit, test assembly and method for testing an integra...
- Patent number 11,874,325
- Issue date Jan 16, 2024
- Infineon Technologies AG
- Tobias Kilian
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with self-test circuit, method for operating an...
- Patent number 11,619,668
- Issue date Apr 4, 2023
- Infineon Technologies AG
- Daniel Tille
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED TEST CIRCUIT, TEST ASSEMBLY AND METHOD FOR TESTING AN IN...
- Publication number 20230138651
- Publication date May 4, 2023
- INFINEON TECHNOLOGIES AG
- Tobias Kilian
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT, TEST ASSEMBLY AND METHOD FOR TESTING AN INTEGRA...
- Publication number 20230079599
- Publication date Mar 16, 2023
- INFINEON TECHNOLOGIES AG
- Tobias Kilian
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH SELF-TEST CIRCUIT, METHOD FOR OPERATING AN...
- Publication number 20210263099
- Publication date Aug 26, 2021
- INFINEON TECHNOLOGIES AG
- Daniel Tille
- G01 - MEASURING TESTING
Information Patent Application
CHIP AND METHOD FOR TESTING A PROCESSING COMPONENT OF A CHIP
- Publication number 20160377677
- Publication date Dec 29, 2016
- INFINEON TECHNOLOGIES AG
- Daniel TILLE
- G01 - MEASURING TESTING