Daniel W. Prevedel

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Ft. Collins, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Known good die using existing process infrastructure
- Patent number 7,898,275
- Issue date Mar 1, 2011
- Texas Instruments Incorporated
- Richard W. Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Method of implementing an engineering change order in an integrated...
- Patent number 7,231,626
- Issue date Jun 12, 2007
- LSI Corporation
- Jason K. Hoff
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of parasitic extraction from a previously calculated capacit...
- Patent number 7,185,298
- Issue date Feb 27, 2007
- LSI Logic Corporation
- John D. Corbeil, Jr.
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for detecting nets physically changed and elec...
- Patent number 7,168,055
- Issue date Jan 23, 2007
- LSI Logic Corporation
- Jason Hoff
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of testing a semiconductor chip
- Patent number 6,720,574
- Issue date Apr 13, 2004
- Texas Instruments Incorporated
- Richard W. Arnold
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of implementing an engineering change order in an integrated...
- Publication number 20060136855
- Publication date Jun 22, 2006
- LSI Logic Corporation
- Jason K. Hoff
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of parasitic extraction from a previously calculated capacit...
- Publication number 20060136850
- Publication date Jun 22, 2006
- LSI Logic Corporation
- John D. Corbeil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for detecting nets physically changed and elec...
- Publication number 20060036982
- Publication date Feb 16, 2006
- Jason Hoff
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Known good die using existing process infrastructure
- Publication number 20020084515
- Publication date Jul 4, 2002
- Richard W. Arnold
- G01 - MEASURING TESTING