Daniel Woodrow Phifer, JR.

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Eindhoven, NL

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Patents Applicationslast 30 patents

Information Patent Application
CHARGED-PARTICLE MICROSCOPY WITH OCCLUSION DETECTION
- Publication number 20120292503
- Publication date Nov 22, 2012
- FEI Company
- Daniel Woodrow Phifer, JR.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Inspecting a Sample
- Publication number 20110006208
- Publication date Jan 13, 2011
- FEI Company
- Bert Henning Freitag
- G01 - MEASURING TESTING