Daniel Woodrow Phifer JR.

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Environmental scanning electron microscope (ESEM/SEM) gas injection...
- Patent number 9,070,533
- Issue date Jun 30, 2015
- FEI Company
- Marc Castagna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle microscopy with occlusion detection
- Patent number 8,698,078
- Issue date Apr 15, 2014
- FEI Company
- Daniel Woodrow Phifer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for inspecting a sample
- Patent number 8,389,936
- Issue date Mar 5, 2013
- FEI Company
- Bert Henning Freitag
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Environmental SEM Gas Injection System
- Publication number 20140034830
- Publication date Feb 6, 2014
- FEI Company
- Marc Castagna
- H01 - BASIC ELECTRIC ELEMENTS