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Danielle Ann Braje
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Winchester, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Oscillator-based solid-state spin sensor
Patent number
12,032,044
Issue date
Jul 9, 2024
Massachusetts Institute of Technology
Danielle A. Braje
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ferrimagnetic oscillator magnetometer
Patent number
11,774,520
Issue date
Oct 3, 2023
Massachusetts Institute of Technology
John F. Barry
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Spin-based electrometry with solid-state defects
Patent number
11,448,676
Issue date
Sep 20, 2022
Massachusetts Institute of Technology
Danielle Ann Braje
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for optically detecting magnetic resonance
Patent number
11,346,904
Issue date
May 31, 2022
Massachusetts Institute of Technology
Linh M. Pham
G01 - MEASURING TESTING
Information
Patent Grant
Chopped bias magnetic field solid-state spin sensor for low frequen...
Patent number
11,041,916
Issue date
Jun 22, 2021
Massachusetts Institute of Technology
Linh M. Pham
G01 - MEASURING TESTING
Information
Patent Grant
Microwave resonator readout of an ensemble solid state spin sensor
Patent number
10,962,611
Issue date
Mar 30, 2021
Massachusetts Institute of Technology
John F. Barry
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for optically detecting magnetic resonance
Patent number
10,712,408
Issue date
Jul 14, 2020
Massachusetts Institute of Technology
Linh M. Pham
G01 - MEASURING TESTING
Information
Patent Grant
Stationary magic angle spinning enhanced solid state spin sensor
Patent number
10,705,163
Issue date
Jul 7, 2020
Massachusetts Institute of Technology
John F. Barry
G01 - MEASURING TESTING
Information
Patent Grant
Spin-based electrometry with solid-state defects
Patent number
10,620,251
Issue date
Apr 14, 2020
Massachusetts Institute of Technology
Danielle Ann Braje
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Quantum Mixer to Sense Arbitrary-Frequency Fields
Publication number
20240135224
Publication date
Apr 25, 2024
Massachusetts Institute of Technology
Guoqing WANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Ferrimagnetic Oscillator Magnetometer
Publication number
20220011383
Publication date
Jan 13, 2022
Massachusetts Institute of Technology
John F. Barry
G01 - MEASURING TESTING
Information
Patent Application
Oscillator-based Solid-State Spin Sensor
Publication number
20210263117
Publication date
Aug 26, 2021
Danielle A. Braje
G01 - MEASURING TESTING
Information
Patent Application
Microwave Resonator Readout of an Ensemble Solid State Spin Sensor
Publication number
20210255258
Publication date
Aug 19, 2021
Massachusetts Institute of Technology
John F. Barry
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR OPTICALLY DETECTING MAGNETIC RESONANCE
Publication number
20210011098
Publication date
Jan 14, 2021
Massachusetts Institute of Technology
Linh M. Pham
G01 - MEASURING TESTING
Information
Patent Application
SPIN-BASED ELECTROMETRY WITH SOLID-STATE DEFECTS
Publication number
20200284828
Publication date
Sep 10, 2020
Massachusetts Institute of Technology
Danielle Ann Braje
G01 - MEASURING TESTING
Information
Patent Application
Microwave Resonator Readout of an Ensemble Solid State Spin Sensor
Publication number
20200064419
Publication date
Feb 27, 2020
John F. Barry
G01 - MEASURING TESTING
Information
Patent Application
Chopped Bias Magnetic Field Solid-State Spin Sensor For Low Frequen...
Publication number
20200025835
Publication date
Jan 23, 2020
Linh M. Pham
G01 - MEASURING TESTING
Information
Patent Application
Stationary Magic Angle Spinning Enhanced Solid State Spin Sensor
Publication number
20190178958
Publication date
Jun 13, 2019
John F. Barry
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR OPTICALLY DETECTING MAGNETIC RESONANCE
Publication number
20180136291
Publication date
May 17, 2018
Linh M. Pham
G01 - MEASURING TESTING
Information
Patent Application
SPIN-BASED ELECTROMETRY WITH SOLID-STATE DEFECTS
Publication number
20170370979
Publication date
Dec 28, 2017
Danielle Ann Braje
G01 - MEASURING TESTING