Danielle R. Chianese

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Poughkeepsie, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Offset determination method for measurement system matching
- Patent number 7,853,345
- Issue date Dec 14, 2010
- International Business Machines Corporation
- Andrew C. Brendler
- G01 - MEASURING TESTING
Information Patent Grant
Offset determination for measurement system matching
- Patent number 7,318,206
- Issue date Jan 8, 2008
- International Business Machines Corporation
- Andrew C. Brendler
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
OFFSET DETERMINATION FOR MEASUREMENT SYSTEM MATCHING
- Publication number 20080015815
- Publication date Jan 17, 2008
- Andrew C. Brendler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OFFSET DETERMINATION FOR MEASUREMENT SYSTEM MATCHING
- Publication number 20070078612
- Publication date Apr 5, 2007
- International Business Machines Corporation
- Andrew C. Brendler
- G06 - COMPUTING CALCULATING COUNTING