Danilo De Simone

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Leuven, BE

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Patents Grantslast 30 patents

Information Patent Grant
Method for producing a pattern of features by lithography and etching
- Patent number 10,818,504
- Issue date Oct 27, 2020
- Imec VZW
- Waikin Li
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
State Transition Temperature of Resist Structures
- Publication number 20240125721
- Publication date Apr 18, 2024
- IMEC vzw
- Joren Severi
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PERFORMING METROLOGY ON A MICROFABRICATION PATTERN
- Publication number 20230298854
- Publication date Sep 21, 2023
- IMEC vzw
- Joren Severi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Height Metrology Using an E-Beam System
- Publication number 20220392742
- Publication date Dec 8, 2022
- IMEC vzw
- Gian Francesco Lorusso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Producing a Pattern of Features by Lithography and Etching
- Publication number 20190189458
- Publication date Jun 20, 2019
- IMEC vzw
- Waikin Li
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY