Danish Hasan Syed

Person

New Delhi, IN

People

Patents Grantslast 30 patents

Information Patent Grant
Communication logic to enhance area effectiveness for memory repair...
- Patent number 12,204,782
- Issue date Jan 21, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Urmishkumar Karsanbhai Patel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-the-fly test and debug logic for ATPG failures of designs using...
- Patent number 10,094,876
- Issue date Oct 9, 2018
- STMicroelectronics International N.V.
- Danish Hasan Syed
- G01 - MEASURING TESTING
Information Patent Grant
On-the-fly test and debug logic for ATPG failures of designs using...
- Patent number 9,482,719
- Issue date Nov 1, 2016
- STMicroelectronics International N.V.
- Danish Hasan Syed
- G01 - MEASURING TESTING
Information Patent Grant
Self test structure for interconnect and logic element testing in p...
- Patent number 7,779,318
- Issue date Aug 17, 2010
- Danish Hasan Syed
- G01 - MEASURING TESTING
Information Patent Grant
Efficient content addressable memory array for classless inter-doma...
- Patent number 7,266,005
- Issue date Sep 4, 2007
- STMicroelectronics Pvt. Ltd.
- Danish Hasan Syed
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems for built-in-self-test for content addressable memories and...
- Patent number 7,130,230
- Issue date Oct 31, 2006
- STMicroelectronics Pvt. Ltd.
- Mohit Jain
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
COMMUNICATION LOGIC TO ENHANCE AREA EFFECTIVENESS FOR MEMORY REPAIR...
- Publication number 20240427514
- Publication date Dec 26, 2024
- STMicroelectronics International N.V.
- Urmishkumar Karsanbhai Patel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-THE-FLY TEST AND DEBUG LOGIC FOR ATPG FAILURES OF DESIGNS USING...
- Publication number 20170023647
- Publication date Jan 26, 2017
- STMicroelectronics International N.V
- Danish Hasan Syed
- G01 - MEASURING TESTING
Information Patent Application
ON-THE-FLY TEST AND DEBUG LOGIC FOR ATPG FAILURES OF DESIGNS USING...
- Publication number 20150198663
- Publication date Jul 16, 2015
- STMicroelectronics International N.V
- Danish Hasan Syed
- G01 - MEASURING TESTING
Information Patent Application
Self test structure for interconnect and logic element testing in p...
- Publication number 20070011539
- Publication date Jan 11, 2007
- STMicroelectronics Pvt. Ltd.
- Danish Hasan Syed
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Efficient content addressable memory array for classless inter-doma...
- Publication number 20060155926
- Publication date Jul 13, 2006
- STMicroelectronics Pvt. Ltd.
- Danish Hasan Syed
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Content addressable memory for CIDR address searches
- Publication number 20050135135
- Publication date Jun 23, 2005
- STMicroelectronics Pvt. Ltd.
- Abhishek Sharma
- G11 - INFORMATION STORAGE
Information Patent Application
Systems for Built-In-Self-Test for content addressable memories and...
- Publication number 20050088904
- Publication date Apr 28, 2005
- STMicroelectronics Pvt. Ltd.
- Mohit Jain
- G11 - INFORMATION STORAGE

Danish Hasan Syed

Person

Patents Grantslast 30 patents

Communication logic to enhance area effectiveness for memory repair...

On-the-fly test and debug logic for ATPG failures of designs using...

On-the-fly test and debug logic for ATPG failures of designs using...

Self test structure for interconnect and logic element testing in p...

Efficient content addressable memory array for classless inter-doma...

Systems for built-in-self-test for content addressable memories and...

Patents Applicationslast 30 patents

COMMUNICATION LOGIC TO ENHANCE AREA EFFECTIVENESS FOR MEMORY REPAIR...

ON-THE-FLY TEST AND DEBUG LOGIC FOR ATPG FAILURES OF DESIGNS USING...

ON-THE-FLY TEST AND DEBUG LOGIC FOR ATPG FAILURES OF DESIGNS USING...

Self test structure for interconnect and logic element testing in p...

Efficient content addressable memory array for classless inter-doma...

Content addressable memory for CIDR address searches

Systems for Built-In-Self-Test for content addressable memories and...