Daphna Peimer

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Rehovot, IL

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Patents Applicationslast 30 patents

Information Patent Application
METROLOGY TECHNIQUE FOR SEMICONDUCTOR DEVICES
- Publication number 20240271926
- Publication date Aug 15, 2024
- NOVA LTD
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
- Publication number 20240085805
- Publication date Mar 14, 2024
- NOVA LTD
- Gilad BARAK
- H01 - BASIC ELECTRIC ELEMENTS