Daphna R. Yaniv

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Scottsdale, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Atomic force microscope employing beam-tracking
- Patent number 5,763,767
- Issue date Jun 9, 1998
- Molecular Imaging Corp.
- Pan S. Jung
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope employing beam tracking
- Patent number 5,587,523
- Issue date Dec 24, 1996
- Molecular Imaging Corporation
- Pan S. Jung
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning force microscope with beam tracking lens
- Patent number 5,440,920
- Issue date Aug 15, 1995
- Molecular Imaging Systems
- Pan S. Jung
- B82 - NANO-TECHNOLOGY