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Darin S. Olson
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Menlo Park, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated circuit micro-cooler having multi-layers of tubes of a C...
Patent number
7,538,422
Issue date
May 26, 2009
Nanoconduction Inc.
Carlos Dangelo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for use of hydrogen and silanes in plasma
Patent number
6,448,186
Issue date
Sep 10, 2002
Novellus Systems, Inc.
Darin S. Olson
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Pulsed or tailored bias for filling gaps with low dielectric consta...
Patent number
6,376,391
Issue date
Apr 23, 2002
Darin Scott Olson
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Deposition of low dielectric constant thin film without use of an o...
Patent number
6,331,494
Issue date
Dec 18, 2001
Novellus Systems, Inc.
Darin Scott Olson
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Point-of-use vaporization system and method
Patent number
6,022,416
Issue date
Feb 8, 2000
Novellus Systems, Inc.
Darin S. Olson
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Patents Applications
last 30 patents
Information
Patent Application
Integrated Circuit Micro-Cooler Having Tubes of a CNT Array in Esse...
Publication number
20070126116
Publication date
Jun 7, 2007
Carlos Dangelo
B82 - NANO-TECHNOLOGY
Information
Patent Application
INTEGRATED CIRCUIT MICRO-COOLER HAVING MULTI-LAYERS OF TUBES OF A C...
Publication number
20070114657
Publication date
May 24, 2007
Carlos Dangelo
B82 - NANO-TECHNOLOGY
Information
Patent Application
Integrated Circuit Micro-Cooler with Double-Sided Tubes of a CNT Array
Publication number
20070114658
Publication date
May 24, 2007
Carlos Dangelo
B82 - NANO-TECHNOLOGY
Information
Patent Application
Nanoelectronic sensor system and hydrogen-sensitive functionalization
Publication number
20060263255
Publication date
Nov 23, 2006
Tzong-Ru Han
G01 - MEASURING TESTING