Darrell E. Schlicker

Person

Watertown, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Performance curve generation for non-destructive testing sensors
- Patent number 10,001,457
- Issue date Jun 19, 2018
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Durability enhanced and redundant embedded sensors
- Patent number 9,279,784
- Issue date Mar 8, 2016
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for load and additional property measurement
- Patent number 9,207,131
- Issue date Dec 8, 2015
- Jentek Sensors, Inc.
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Grant
Durability enhanced and redundant embedded sensors
- Patent number 8,803,515
- Issue date Aug 12, 2014
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method for stress assessment that removes temperature effects and h...
- Patent number 8,415,947
- Issue date Apr 9, 2013
- Jentek Sensors, Inc.
- Yanko K. Sheiretov
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field characterization of stresses and properties in mater...
- Patent number 8,237,433
- Issue date Aug 7, 2012
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit with sense elements having associated and unassociated...
- Patent number 8,222,897
- Issue date Jul 17, 2012
- Jentek Sensors, Inc.
- Yanko K. Sheiretov
- G01 - MEASURING TESTING
Information Patent Grant
Material property estimation using inverse interpolation
- Patent number 8,050,883
- Issue date Nov 1, 2011
- Jentek Sensors, Inc.
- Yanko Konstantinov Sheiretov
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current sensor with concentric segments
- Patent number 7,994,781
- Issue date Aug 9, 2011
- Jentek Sensors, Inc.
- Neil J. Goldfine
- B24 - GRINDING POLISHING
Information Patent Grant
Magnetic field characterization of stresses and properties in mater...
- Patent number 7,876,094
- Issue date Jan 25, 2011
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Material condition assessment with eddy current sensors
- Patent number 7,812,601
- Issue date Oct 12, 2010
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Absolute property measurements using electromagnetic sensors
- Patent number 7,696,748
- Issue date Apr 13, 2010
- Jentek Sensors, Inc.
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Grant
Surface mounted sensor arrays having segmented primary windings
- Patent number 7,589,526
- Issue date Sep 15, 2009
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Quasistatic magnetic and electric field stress/strain gages
- Patent number 7,533,575
- Issue date May 19, 2009
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Applied and residual stress measurements using magnetic field sensors
- Patent number 7,526,964
- Issue date May 5, 2009
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Fastener and fitting based sensing methods
- Patent number 7,528,598
- Issue date May 5, 2009
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid wound/etched winding constructs for scanning and monitoring
- Patent number 7,518,360
- Issue date Apr 14, 2009
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Material property estimation using non-orthogonal responsive databases
- Patent number 7,467,057
- Issue date Dec 16, 2008
- Jentek Sensors, Inc.
- Yanko Konstantinov Sheiretov
- G01 - MEASURING TESTING
Information Patent Grant
Engine blade dovetail inspection
- Patent number 7,451,639
- Issue date Nov 18, 2008
- Jentek Sensors, Inc.
- Neil J Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Material condition monitoring with multiple sensing modes
- Patent number 7,451,657
- Issue date Nov 18, 2008
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
High resolution inductive sensor arrays for UXO
- Patent number 7,411,390
- Issue date Aug 12, 2008
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current sensing arrays and system
- Patent number 7,385,392
- Issue date Jun 10, 2008
- Jentek Sensors, Inc.
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Grant
Method for verifying sensor condition
- Patent number 7,348,771
- Issue date Mar 25, 2008
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Local feature characterization using quasistatic electromagnetic se...
- Patent number 7,289,913
- Issue date Oct 30, 2007
- Jentek Sensors, Inc.
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Grant
Segmented field dielectric sensor array for material characterization
- Patent number 7,280,940
- Issue date Oct 9, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Damage standard fabrication with attached sensor
- Patent number 7,230,421
- Issue date Jun 12, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Self-monitoring metals, alloys and materials
- Patent number 7,188,532
- Issue date Mar 13, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting a channel using a flexible sensor
- Patent number 7,183,764
- Issue date Feb 27, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method for material property monitoring with perforated, surface mo...
- Patent number 7,161,350
- Issue date Jan 9, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Hidden feature characterization using a database of sensor responses
- Patent number 7,161,351
- Issue date Jan 9, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Durability Enhanced And Redundant Embedded Sensors
- Publication number 20150145510
- Publication date May 28, 2015
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Method And Apparatus For Load And Additional Property Measurement
- Publication number 20130269450
- Publication date Oct 17, 2013
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Application
Performance Curve Generation For Non-Destructive Testing Sensors
- Publication number 20120271824
- Publication date Oct 25, 2012
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Material Property Estimation Using Inverse Interpolation
- Publication number 20120013334
- Publication date Jan 19, 2012
- JENTEK Sensors, Inc.
- Yanko Konstantinov Sheiretov
- G01 - MEASURING TESTING
Information Patent Application
Durability Enhanced and Redundant Embedded Sensors
- Publication number 20110210724
- Publication date Sep 1, 2011
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Magnetic Field Characterization of Stresses and Properties in Mater...
- Publication number 20110163742
- Publication date Jul 7, 2011
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Magnetic field characterization of stresses and properties in mater...
- Publication number 20100045277
- Publication date Feb 25, 2010
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Material Condition Assessment with Eddy Current Sensors
- Publication number 20100026285
- Publication date Feb 4, 2010
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
PRIMARY WINDINGS HAVING MULTIPLE PARALLEL EXTENDED PORTIONS
- Publication number 20090315540
- Publication date Dec 24, 2009
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- B24 - GRINDING POLISHING
Information Patent Application
Material property estimation using inverse interpolation
- Publication number 20090192755
- Publication date Jul 30, 2009
- JENTEK Sensors, Inc.
- Yanko Konstantinov Sheiretov
- G01 - MEASURING TESTING
Information Patent Application
Torque and load monitoring using magnetic sensor arrays
- Publication number 20090001974
- Publication date Jan 1, 2009
- JENTEK Sensors, Inc.
- Yanko K. Sheiretov
- G01 - MEASURING TESTING
Information Patent Application
Hybrid wound/etched winding constructs for scanning and monitoring
- Publication number 20080258720
- Publication date Oct 23, 2008
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Engine blade dovetail inspection
- Publication number 20070272042
- Publication date Nov 29, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Quasistatic magnetic and electric field stress/strain gages
- Publication number 20070245834
- Publication date Oct 25, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Primary windings having multiple parallel extended portions
- Publication number 20070236214
- Publication date Oct 11, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Self-monitoring metals, alloys and materials
- Publication number 20070227255
- Publication date Oct 4, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Method for material property monitoring with perforated, surface mo...
- Publication number 20070120561
- Publication date May 31, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Magnetic field characterization of stresses and properties in mater...
- Publication number 20070114993
- Publication date May 24, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Material characterization with model based sensors
- Publication number 20070069720
- Publication date Mar 29, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Test circuit with drive windings and sense elements
- Publication number 20070029997
- Publication date Feb 8, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Fastener and fitting based sensing methods
- Publication number 20070007955
- Publication date Jan 11, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Methods for processing, optimization, calibration and display of me...
- Publication number 20060265155
- Publication date Nov 23, 2006
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Material condition assessment with eddy current sensors
- Publication number 20060244443
- Publication date Nov 2, 2006
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Segmented field dielectric sensor array for material characterization
- Publication number 20060247896
- Publication date Nov 2, 2006
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Automated drawing tool and method for drawing a sensor layout
- Publication number 20060186880
- Publication date Aug 24, 2006
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Application
Local feature characterization using quasistatic electromagnetic se...
- Publication number 20060097718
- Publication date May 11, 2006
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Application
Surface mounted and scanning spatially periodic eddy-current sensor...
- Publication number 20060082366
- Publication date Apr 20, 2006
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Segmented field sensors
- Publication number 20060076952
- Publication date Apr 13, 2006
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Magnetic field sensor having a switchable drive current spatial dis...
- Publication number 20060009923
- Publication date Jan 12, 2006
- Ian Shay
- G01 - MEASURING TESTING
Information Patent Application
Segmented field sensors
- Publication number 20050248339
- Publication date Nov 10, 2005
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING

Darrell E. Schlicker

Person

Patents Grantslast 30 patents

Performance curve generation for non-destructive testing sensors

Durability enhanced and redundant embedded sensors

Method and apparatus for load and additional property measurement

Durability enhanced and redundant embedded sensors

Method for stress assessment that removes temperature effects and h...

Magnetic field characterization of stresses and properties in mater...

Test circuit with sense elements having associated and unassociated...

Material property estimation using inverse interpolation

Eddy current sensor with concentric segments

Magnetic field characterization of stresses and properties in mater...

Material condition assessment with eddy current sensors

Absolute property measurements using electromagnetic sensors

Surface mounted sensor arrays having segmented primary windings

Quasistatic magnetic and electric field stress/strain gages

Applied and residual stress measurements using magnetic field sensors

Fastener and fitting based sensing methods

Hybrid wound/etched winding constructs for scanning and monitoring

Material property estimation using non-orthogonal responsive databases

Engine blade dovetail inspection

Material condition monitoring with multiple sensing modes

High resolution inductive sensor arrays for UXO

Eddy current sensing arrays and system

Method for verifying sensor condition

Local feature characterization using quasistatic electromagnetic se...

Segmented field dielectric sensor array for material characterization

Damage standard fabrication with attached sensor

Self-monitoring metals, alloys and materials

Method for inspecting a channel using a flexible sensor

Method for material property monitoring with perforated, surface mo...

Hidden feature characterization using a database of sensor responses

Patents Applicationslast 30 patents

Durability Enhanced And Redundant Embedded Sensors

Method And Apparatus For Load And Additional Property Measurement

Performance Curve Generation For Non-Destructive Testing Sensors

Material Property Estimation Using Inverse Interpolation

Durability Enhanced and Redundant Embedded Sensors

Magnetic Field Characterization of Stresses and Properties in Mater...

Magnetic field characterization of stresses and properties in mater...

Material Condition Assessment with Eddy Current Sensors

PRIMARY WINDINGS HAVING MULTIPLE PARALLEL EXTENDED PORTIONS

Material property estimation using inverse interpolation

Torque and load monitoring using magnetic sensor arrays

Hybrid wound/etched winding constructs for scanning and monitoring

Engine blade dovetail inspection

Quasistatic magnetic and electric field stress/strain gages

Primary windings having multiple parallel extended portions

Self-monitoring metals, alloys and materials

Method for material property monitoring with perforated, surface mo...

Magnetic field characterization of stresses and properties in mater...

Material characterization with model based sensors

Test circuit with drive windings and sense elements

Fastener and fitting based sensing methods

Methods for processing, optimization, calibration and display of me...

Material condition assessment with eddy current sensors

Segmented field dielectric sensor array for material characterization

Automated drawing tool and method for drawing a sensor layout

Local feature characterization using quasistatic electromagnetic se...

Surface mounted and scanning spatially periodic eddy-current sensor...

Segmented field sensors

Magnetic field sensor having a switchable drive current spatial dis...

Segmented field sensors