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Darrell L. Gourley
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San Francisco, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Multimode ionization source
Patent number
7,488,953
Issue date
Feb 10, 2009
Agilent Technologies, Inc.
Steven M. Fischer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion sampling for APPI mass spectrometry
Patent number
7,309,859
Issue date
Dec 18, 2007
Agilent Technologies, Inc.
Steven M. Fischer
G01 - MEASURING TESTING
Information
Patent Grant
Multimode ionization mode separator
Patent number
7,223,968
Issue date
May 29, 2007
Agilent Technologies, Inc.
Steven M. Fischer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for sensor control and feedback
Patent number
7,180,059
Issue date
Feb 20, 2007
Agilent Technologies, Inc.
Steven M. Fischer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for sensor control and feedback
Patent number
7,091,483
Issue date
Aug 15, 2006
Agilent Technologies, Inc.
Steven M. Fischer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multimode ionization source
Patent number
7,078,681
Issue date
Jul 18, 2006
Agilent Technologies, Inc.
Steven M. Fischer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multimode ionization mode separator
Patent number
7,034,291
Issue date
Apr 25, 2006
Agilent Technologies, Inc.
Steven M. Fischer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion sampling for APPI mass spectrometry
Patent number
7,002,146
Issue date
Feb 21, 2006
Agilent Technologies, Inc.
Steven M. Fischer
G01 - MEASURING TESTING
Information
Patent Grant
Ion sampling for APPI mass spectrometry
Patent number
6,812,459
Issue date
Nov 2, 2004
Agilent Technologies, Inc.
Steven M. Fischer
G01 - MEASURING TESTING
Information
Patent Grant
Ion sampling for APPI mass spectrometry
Patent number
6,653,626
Issue date
Nov 25, 2003
Agilent Technologies, Inc.
Steven M. Fischer
G01 - MEASURING TESTING
Information
Patent Grant
Atmospheric pressure photoionization source in mass spectrometry
Patent number
6,646,256
Issue date
Nov 11, 2003
Agilent Technologies, Inc.
Darrell L. Gourley
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multimode ionization source
Patent number
6,646,257
Issue date
Nov 11, 2003
Agilent Technologies, Inc.
Steven M. Fischer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for forming liquid droplets having a mechanically fixed i...
Patent number
6,032,876
Issue date
Mar 7, 2000
Hewlett-Packard Company
James L. Bertsch
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for forming liquid droplets having a mechanically fixed i...
Patent number
5,868,322
Issue date
Feb 9, 1999
Hewlett-Packard Company
Harvey D. Loucks
G01 - MEASURING TESTING
Information
Patent Grant
Angled chamber seal for atmospheric pressure ionization mass spectr...
Patent number
5,753,910
Issue date
May 19, 1998
Hewlett-Packard Company
Darrell L. Gourley
G01 - MEASURING TESTING
Information
Patent Grant
Ionization chamber and mass spectrometer having a corona needle whi...
Patent number
5,726,447
Issue date
Mar 10, 1998
Hewlett-Packard Company
Edward Aisawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Self generating ion device for mass spectrometry of liquids
Patent number
5,559,326
Issue date
Sep 24, 1996
Hewlett-Packard Company
Paul C. Goodley
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Multimode ionization source
Publication number
20070023675
Publication date
Feb 1, 2007
Steven M. Fischer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for sensor control and feedback
Publication number
20060243917
Publication date
Nov 2, 2006
Steven M. Fischer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Multimode ionization mode separator
Publication number
20060124859
Publication date
Jun 15, 2006
Steven M. Fischer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTIMODE IONIZATION MODE SEPARATOR
Publication number
20060086908
Publication date
Apr 27, 2006
Steven M. Fischer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion sampling for APPI mass spectrometry
Publication number
20060076505
Publication date
Apr 13, 2006
Steven M. Fischer
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for sensor control and feedback
Publication number
20050211911
Publication date
Sep 29, 2005
Steven M. Fischer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion sampling for APPI mass spectrometry
Publication number
20050045833
Publication date
Mar 3, 2005
Steven M. Fischer
G01 - MEASURING TESTING
Information
Patent Application
Multimode ionization source
Publication number
20040079881
Publication date
Apr 29, 2004
Steven M. Fischer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion sampling for APPI mass spectrometry
Publication number
20040046126
Publication date
Mar 11, 2004
Steven M. Fisher
G01 - MEASURING TESTING
Information
Patent Application
Atmospheric pressure photoionization source in mass spectrometry
Publication number
20030111598
Publication date
Jun 19, 2003
Darrell L. Gourley
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion sampling for APPI mass spectrometry
Publication number
20020179832
Publication date
Dec 5, 2002
Steven M. Fischer
G01 - MEASURING TESTING