Darren Forman

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Bend, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for evaluating microstructures on a workpiece based on the o...
- Patent number 8,027,037
- Issue date Sep 27, 2011
- Nanometrics Incorporated
- Mike Littau
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating microstructures on a workpiece based on the o...
- Patent number 7,656,542
- Issue date Feb 2, 2010
- Nanometrics Incorporated
- Mike Littau
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Evaluating Microstructures on a Workpiece Based on the O...
- Publication number 20100135571
- Publication date Jun 3, 2010
- Nanometrics Incorporated
- Mike Littau
- G01 - MEASURING TESTING
Information Patent Application
Method for evaluating microstructures on a workpiece based on the o...
- Publication number 20070211261
- Publication date Sep 13, 2007
- Mike Littau
- G01 - MEASURING TESTING
Information Patent Application
Apparatuses and methods for enhanced critical dimension scatterometry
- Publication number 20060285111
- Publication date Dec 21, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING