Darrick Hay

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Brandon, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus of wavefront and polarization profile of vect...
- Patent number 11,709,097
- Issue date Jul 25, 2023
- University of South Florida
- Zhimin Shi
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus of wavefront and polarization profile of vect...
- Patent number 11,067,450
- Issue date Jul 20, 2021
- University of South Florida
- Zhimin Shi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT APPARATUS OF WAVEFRONT AND POLARIZATION PROFILE OF VECT...
- Publication number 20220011163
- Publication date Jan 13, 2022
- The University of Rochester
- Zhimin Shi
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS OF WAVEFRONT AND POLARIZATION PROFILE OF VECT...
- Publication number 20200011737
- Publication date Jan 9, 2020
- The University of Rochester
- Zhimin Shi
- G01 - MEASURING TESTING