Darryl G. Walker

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Temperature sensor circuits for integrated circuit devices
- Patent number 12,294,357
- Issue date May 6, 2025
- Samsung Electronics Co., Ltd.
- Darryl G. Walker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature sensor circuits for integrated circuit devices
- Patent number 12,184,271
- Issue date Dec 31, 2024
- Samsung Electronics Co., Ltd.
- Darryl G. Walker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
ESD protection for integrated circuit devices
- Patent number 12,119,641
- Issue date Oct 15, 2024
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device including an SRAM portion having end powe...
- Patent number 11,972,793
- Issue date Apr 30, 2024
- Mavagail Technology, LLC
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Grant
ESD protection for integrated circuit devices
- Patent number 11,973,342
- Issue date Apr 30, 2024
- Mavagail Technology, LLC
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device including an SRAM portion having end powe...
- Patent number 11,955,171
- Issue date Apr 9, 2024
- Mavagail Technology, LLC
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Grant
Temperature sensor circuits for integrated circuit devices
- Patent number 11,949,408
- Issue date Apr 2, 2024
- Mavagail Technology, LLC
- Darryl G. Walker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature sensor circuits for integrated circuit devices
- Patent number 11,777,486
- Issue date Oct 3, 2023
- Mavagail Technology, LLC
- Darryl G. Walker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature sensor circuits for integrated circuit devices
- Patent number 11,689,198
- Issue date Jun 27, 2023
- Mavagail Technology, LLC
- Darryl G. Walker
- G01 - MEASURING TESTING
Information Patent Grant
ESD protection for integrated circuit devices
- Patent number 11,664,656
- Issue date May 30, 2023
- Mavagail Technology, LLC
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection for integrated circuit devices
- Patent number 11,641,105
- Issue date May 2, 2023
- Mavagail Technology, LLC
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature sensor circuits for integrated circuit devices
- Patent number 11,515,871
- Issue date Nov 29, 2022
- Mavagail Technology, LLC
- Darryl G. Walker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature sensor circuits for integrated circuit devices
- Patent number 11,381,235
- Issue date Jul 5, 2022
- Mavagail Technology, LLC
- Darryl G. Walker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
ESD protection for integrated circuit devices
- Patent number 11,368,016
- Issue date Jun 21, 2022
- Mavagail Technology, LLC
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and method having temperature sensing c...
- Patent number 10,996,115
- Issue date May 4, 2021
- Samsung Electronics Co., Ltd.
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor devices, circuits and methods for read and/or write a...
- Patent number 10,665,294
- Issue date May 26, 2020
- Samsung Electronics Co., Ltd.
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having variable parameter selection based on t...
- Patent number 10,656,028
- Issue date May 19, 2020
- Samsung Electronics Co., Ltd.
- Darryl G. Walker
- G01 - MEASURING TESTING
Information Patent Grant
Testing a semiconductor device including a voltage detection circui...
- Patent number 10,622,085
- Issue date Apr 14, 2020
- Samsung Electronics Co., Ltd.
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having temperature circuit that sets temperatu...
- Patent number 10,605,672
- Issue date Mar 31, 2020
- Samsung Electronics Co., Ltd.
- Darryl G. Walker
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor devices, circuits and methods for read and/or write a...
- Patent number 10,497,430
- Issue date Dec 3, 2019
- Samsung Electronics Co., Ltd.
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Grant
Package including a plurality of stacked semiconductor devices, an...
- Patent number 10,453,823
- Issue date Oct 22, 2019
- Samsung Electronics Co., Ltd.
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Grant
Package including a plurality of stacked semiconductor devices havi...
- Patent number 10,418,346
- Issue date Sep 17, 2019
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing a semiconductor device including a voltage detection circui...
- Patent number 10,403,384
- Issue date Sep 3, 2019
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing and setting performance parameters in a semiconductor devic...
- Patent number 10,365,318
- Issue date Jul 30, 2019
- Darryl G. Walker
- G01 - MEASURING TESTING
Information Patent Grant
Package including a plurality of stacked semiconductor devices, an...
- Patent number 10,262,975
- Issue date Apr 16, 2019
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Package including a plurality of stacked semiconductor devices, an...
- Patent number 10,262,976
- Issue date Apr 16, 2019
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having temperature sensor circuit that detects...
- Patent number 10,260,962
- Issue date Apr 16, 2019
- Darryl G. Walker
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Package including a plurality of stacked semiconductor devices, an...
- Patent number 10,177,121
- Issue date Jan 8, 2019
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing a semiconductor device including a voltage detection circui...
- Patent number 10,163,524
- Issue date Dec 25, 2018
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-chip non-volatile semiconductor memory package including heat...
- Patent number 10,141,058
- Issue date Nov 27, 2018
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT DEVICE INCLUDING AN SRAM PORTION HAVING END POWE...
- Publication number 20240203489
- Publication date Jun 20, 2024
- Mavagail Technology, LLC
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Application
ESD PROTECTION FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20230420934
- Publication date Dec 28, 2023
- Mavagail Technology, LLC
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20230412165
- Publication date Dec 21, 2023
- Mavagail Technology, LLC
- Darryl G. Walker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ESD PROTECTION FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20230253784
- Publication date Aug 10, 2023
- Mavagail Technology, LLC
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20230246641
- Publication date Aug 3, 2023
- Mavagail Technology, LLC
- Darryl G. Walker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ESD PROTECTION FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20230238798
- Publication date Jul 27, 2023
- Mavagail Technology, LLC
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE INCLUDING AN SRAM PORTION HAVING END POWE...
- Publication number 20230081549
- Publication date Mar 16, 2023
- Mavagail Technology, LLC
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT DEVICE INCLUDING AN SRAM PORTION HAVING END POWE...
- Publication number 20230082215
- Publication date Mar 16, 2023
- Mavagail Technology, LLC
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Application
TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20230052394
- Publication date Feb 16, 2023
- Mavagail Technology, LLC
- Darryl G. Walker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20220278678
- Publication date Sep 1, 2022
- Mavagail Technology, LLC
- Darryl G. Walker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ESD PROTECTION FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20220247172
- Publication date Aug 4, 2022
- Mavagail Technology, LLC
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20210366804
- Publication date Nov 25, 2021
- Mavagail Technology, LLC
- Darryl G. Walker
- G05 - CONTROLLING REGULATING
Information Patent Application
TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20210366803
- Publication date Nov 25, 2021
- Mavagail Technology, LLC
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20210367591
- Publication date Nov 25, 2021
- Mavagail Technology, LLC
- Darryl G. Walker
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ESD PROTECTION FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20210296306
- Publication date Sep 23, 2021
- Mavagail Technology, LLC
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD PROTECTION FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20210296889
- Publication date Sep 23, 2021
- Mavagail Technology, LLC
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD PROTECTION FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20210296307
- Publication date Sep 23, 2021
- Mavagail Technology, LLC
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING A SEMICONDUCTOR DEVICE INCLUDING A VOLTAGE DETECTION CIRCUI...
- Publication number 20190130988
- Publication date May 2, 2019
- Darryl G. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES, CIRCUITS AND METHODS FOR READ AND/OR WRITE A...
- Publication number 20190074055
- Publication date Mar 7, 2019
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING AND SETTING PERFORMANCE PARAMETERS IN A SEMICONDUCTOR DEVIC...
- Publication number 20180306854
- Publication date Oct 25, 2018
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD HAVING TEMPERATURE SENSING C...
- Publication number 20180245989
- Publication date Aug 30, 2018
- Darryl G. Walker
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICES, CIRCUITS AND METHODS FOR READ AND/OR WRITE A...
- Publication number 20180233195
- Publication date Aug 16, 2018
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE HAVING TEMPERATURE SENSOR CIRCUIT THAT DETECTS...
- Publication number 20180231421
- Publication date Aug 16, 2018
- Darryl G. Walker
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICE HAVING TEMPERATURE CIRCUIT THAT SETS TEMPERATU...
- Publication number 20180058944
- Publication date Mar 1, 2018
- Darryl G. Walker
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE HAVING TEMPERATURE SENSOR CIRCUIT THAT DETECTS...
- Publication number 20180010968
- Publication date Jan 11, 2018
- Darryl G. Walker
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON T...
- Publication number 20180003568
- Publication date Jan 4, 2018
- NYTELL SOFTWARE LLC
- Darryl G. Walker
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICES, CIRCUITS AND METHODS FOR READ AND/OR WRITE A...
- Publication number 20170372774
- Publication date Dec 28, 2017
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICES, CIRCUITS AND METHODS FOR READ AND/OR WRITE A...
- Publication number 20170372775
- Publication date Dec 28, 2017
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICES, CIRCUITS AND METHODS FOR READ AND/OR WRITE A...
- Publication number 20170372773
- Publication date Dec 28, 2017
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICES, CIRCUITS AND METHODS FOR READ AND/OR WRITE A...
- Publication number 20170372776
- Publication date Dec 28, 2017
- Darryl G. Walker
- G11 - INFORMATION STORAGE

Darryl G. Walker

Person

Patents Grantslast 30 patents

Temperature sensor circuits for integrated circuit devices

Temperature sensor circuits for integrated circuit devices

ESD protection for integrated circuit devices

Integrated circuit device including an SRAM portion having end powe...

ESD protection for integrated circuit devices

Integrated circuit device including an SRAM portion having end powe...

Temperature sensor circuits for integrated circuit devices

Temperature sensor circuits for integrated circuit devices

Temperature sensor circuits for integrated circuit devices

ESD protection for integrated circuit devices

ESD protection for integrated circuit devices

Temperature sensor circuits for integrated circuit devices

Temperature sensor circuits for integrated circuit devices

ESD protection for integrated circuit devices

Semiconductor memory device and method having temperature sensing c...

Semiconductor devices, circuits and methods for read and/or write a...

Semiconductor device having variable parameter selection based on t...

Testing a semiconductor device including a voltage detection circui...

Semiconductor device having temperature circuit that sets temperatu...

Semiconductor devices, circuits and methods for read and/or write a...

Package including a plurality of stacked semiconductor devices, an...

Package including a plurality of stacked semiconductor devices havi...

Testing a semiconductor device including a voltage detection circui...

Testing and setting performance parameters in a semiconductor devic...

Package including a plurality of stacked semiconductor devices, an...

Package including a plurality of stacked semiconductor devices, an...

Semiconductor device having temperature sensor circuit that detects...

Package including a plurality of stacked semiconductor devices, an...

Testing a semiconductor device including a voltage detection circui...

Multi-chip non-volatile semiconductor memory package including heat...

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT DEVICE INCLUDING AN SRAM PORTION HAVING END POWE...

ESD PROTECTION FOR INTEGRATED CIRCUIT DEVICES

TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES

ESD PROTECTION FOR INTEGRATED CIRCUIT DEVICES

TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES

ESD PROTECTION FOR INTEGRATED CIRCUIT DEVICES

INTEGRATED CIRCUIT DEVICE INCLUDING AN SRAM PORTION HAVING END POWE...

INTEGRATED CIRCUIT DEVICE INCLUDING AN SRAM PORTION HAVING END POWE...

TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES

TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES

ESD PROTECTION FOR INTEGRATED CIRCUIT DEVICES

TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES

TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES

TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES

ESD PROTECTION FOR INTEGRATED CIRCUIT DEVICES

ESD PROTECTION FOR INTEGRATED CIRCUIT DEVICES

ESD PROTECTION FOR INTEGRATED CIRCUIT DEVICES

TESTING A SEMICONDUCTOR DEVICE INCLUDING A VOLTAGE DETECTION CIRCUI...

SEMICONDUCTOR DEVICES, CIRCUITS AND METHODS FOR READ AND/OR WRITE A...

TESTING AND SETTING PERFORMANCE PARAMETERS IN A SEMICONDUCTOR DEVIC...

SEMICONDUCTOR MEMORY DEVICE AND METHOD HAVING TEMPERATURE SENSING C...

SEMICONDUCTOR DEVICES, CIRCUITS AND METHODS FOR READ AND/OR WRITE A...

SEMICONDUCTOR DEVICE HAVING TEMPERATURE SENSOR CIRCUIT THAT DETECTS...

SEMICONDUCTOR DEVICE HAVING TEMPERATURE CIRCUIT THAT SETS TEMPERATU...

SEMICONDUCTOR DEVICE HAVING TEMPERATURE SENSOR CIRCUIT THAT DETECTS...

SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON T...

SEMICONDUCTOR DEVICES, CIRCUITS AND METHODS FOR READ AND/OR WRITE A...

SEMICONDUCTOR DEVICES, CIRCUITS AND METHODS FOR READ AND/OR WRITE A...

SEMICONDUCTOR DEVICES, CIRCUITS AND METHODS FOR READ AND/OR WRITE A...

SEMICONDUCTOR DEVICES, CIRCUITS AND METHODS FOR READ AND/OR WRITE A...