Daryoosh Saeedkia

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Waterloo, CA

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for thickness measurement of multi-layer struct...
- Patent number 11,060,859
- Issue date Jul 13, 2021
- TeTechS Inc.
- Daryoosh Saeedkia
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for identifying and sorting materials using t...
- Patent number 9,239,286
- Issue date Jan 19, 2016
- TeTechS Inc.
- Daryoosh Saeedkia
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Enclosure with integrated terahertz photoconductive antenna and ter...
- Patent number 9,222,829
- Issue date Dec 29, 2015
- TeTechS Inc.
- Daryoosh Saeedkia
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR THICKNESS MEASUREMENT OF MULTI-LAYER STRUCT...
- Publication number 20190078873
- Publication date Mar 14, 2019
- TETECHS INC.
- Daryoosh SAEEDKIA
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR THICKNESS MEASUREMENT OF MULTI-LAYER STRUCT...
- Publication number 20190041200
- Publication date Feb 7, 2019
- TETECHS INC.
- Daryoosh SAEEDKIA
- G01 - MEASURING TESTING
Information Patent Application
ENCLOSURE WITH INTEGRATED TERAHERTZ PHOTOCONDUCTIVE ANTENNA AND TER...
- Publication number 20150204717
- Publication date Jul 23, 2015
- TETECHS INC.
- Daryoosh Saeedkia
- G02 - OPTICS
Information Patent Application
METHODS AND APPARATUS FOR IDENTIFYING AND SORTING MATERIALS USING T...
- Publication number 20140367316
- Publication date Dec 18, 2014
- TETECHS INC.
- Daryoosh Saeedkia
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
TERAHERTZ AND MILLIMETER-WAVE WHISPERING GALLERY MODE RESONATOR SYS...
- Publication number 20110253897
- Publication date Oct 20, 2011
- T-RAY SCIENCE INC.
- Daryoosh Saeedkia
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR CARRYING PHOTOCONDUCTIVE INTEGRATED CIRCUITS
- Publication number 20100067203
- Publication date Mar 18, 2010
- T-RAY SCIENCE INC.
- Safieddin Safavi-Naeini
- G01 - MEASURING TESTING