DAVE ARMSTRONG

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SANTA CLARA, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Adaptive thermal control
- Patent number 9,291,667
- Issue date Mar 22, 2016
- Advantest Corporation
- David H. Armstrong
- G05 - CONTROLLING REGULATING
Information Patent Grant
Probability density function separating apparatus, probability dens...
- Patent number 7,949,484
- Issue date May 24, 2011
- Advantest Corporation
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Probability density function separating apparatus, probability dens...
- Patent number 7,856,463
- Issue date Dec 21, 2010
- Advantest Corporation
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Pattern controlled, full speed ATE compare capability for determini...
- Patent number 7,788,562
- Issue date Aug 31, 2010
- Advantest Corporation
- Thomas Joseph Brennan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE UNDER TEST TEMPERATURE SYNCHRONIZED WITH TEST PATTERN
- Publication number 20190086468
- Publication date Mar 21, 2019
- Advantest Corporation
- TAKATOSHI YOSHINO
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE THERMAL CONTROL
- Publication number 20140253155
- Publication date Sep 11, 2014
- Advantest Corporation
- David H. ARMSTRONG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF PROTECTING PROBES BY USING AN INTELLIGENT CURR...
- Publication number 20140070831
- Publication date Mar 13, 2014
- Advantest Corporation
- Eric Barr KUSHNICK
- G01 - MEASURING TESTING
Information Patent Application
PROBABILITY DENSITY FUNCTION SEPARATING APPARATUS, PROBABILITY DENS...
- Publication number 20090326845
- Publication date Dec 31, 2009
- Advantest Corporation
- TAKAHIRO YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Pattern controlled, full speed ATE compare capability for determini...
- Publication number 20080126899
- Publication date May 29, 2008
- Advantest Corporation
- Thomas Joseph Brennan
- G01 - MEASURING TESTING
Information Patent Application
PROBABILITY DENSITY FUNCTION SEPARATING APPARATUS, PROBABILITY DENS...
- Publication number 20080098055
- Publication date Apr 24, 2008
- Takahiro YAMAGUCHI
- G01 - MEASURING TESTING