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Dave Lessard
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Montreal, CA
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last 30 patents
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Patent Grant
Method and apparatus for measuring a thickness of a thin film in mo...
Patent number
7,272,972
Issue date
Sep 25, 2007
Avestor Limited Partnership
Dave Lessard
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method and apparatus for measuring a thickness of a thin film in mo...
Publication number
20060288771
Publication date
Dec 28, 2006
Dave Lessard
G01 - MEASURING TESTING