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Dave Majernik
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Mt. Airy, MD, US
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last 30 patents
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Patent Grant
Method and apparatus for testing a system-on-a-chip
Patent number
6,964,004
Issue date
Nov 8, 2005
Ardext Technologies, Inc.
Abhijit Chatterjee
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method for using an alternate performance test to reduce test time...
Publication number
20060106555
Publication date
May 18, 2006
Ram Voorakaranam
G01 - MEASURING TESTING
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Patent Application
Method for using an alternate performance test to reduce test time...
Publication number
20040148549
Publication date
Jul 29, 2004
Ram Voorakaranam
G01 - MEASURING TESTING
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Patent Application
Method and apparatus for testing a system-on-a-chip
Publication number
20030158688
Publication date
Aug 21, 2003
Abhijit Chatterjee
G01 - MEASURING TESTING