David A. Chan

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated safety disconnects for power systems
- Patent number 9,478,950
- Issue date Oct 25, 2016
- BENTEK CORPORATION
- James Peplinski
- G05 - CONTROLLING REGULATING
Information Patent Grant
Integrated safety disconnects for power systems
- Patent number 8,687,348
- Issue date Apr 1, 2014
- BENTEK CORPORATION
- Jim Peplinski
- G05 - CONTROLLING REGULATING
Information Patent Grant
Computer-implemented process control in chemical mechanical polishing
- Patent number 8,460,057
- Issue date Jun 11, 2013
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing system with in-line and in-situ metrology
- Patent number 7,927,182
- Issue date Apr 19, 2011
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Grant
Computer-implemented method for process control in chemical mechani...
- Patent number 7,585,202
- Issue date Sep 8, 2009
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Grant
Methods and apparatus for polishing control
- Patent number 7,400,934
- Issue date Jul 15, 2008
- Applied Materials, Inc.
- Manoocher Birang
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing system with in-line and in-situ metrology
- Patent number 7,294,039
- Issue date Nov 13, 2007
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing system with in-line and in-situ metrology
- Patent number 7,101,251
- Issue date Sep 5, 2006
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Grant
Methods and apparatus for polishing control
- Patent number 7,008,875
- Issue date Mar 7, 2006
- Applied Materials Inc.
- Manoocher Birang
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing system with in-line and in-situ metrology
- Patent number 6,939,198
- Issue date Sep 6, 2005
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Grant
Optical monitoring in a two-step chemical mechanical polishing process
- Patent number 6,632,124
- Issue date Oct 14, 2003
- Applied Materials Inc.
- Bret W. Adams
- B24 - GRINDING POLISHING
Information Patent Grant
Optical monitoring in a two-step chemical mechanical polishing process
- Patent number 6,506,097
- Issue date Jan 14, 2003
- Applied Materials, Inc.
- Bret W. Adams
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatus and method for automated collimator exchange
- Patent number 5,519,223
- Issue date May 21, 1996
- ADAC Laboratories, Inc.
- Paul Hug
- G01 - MEASURING TESTING
Information Patent Grant
Proximity detector for body contouring system of a medical camera
- Patent number 5,376,796
- Issue date Dec 27, 1994
- ADAC Laboratories, Inc.
- David A. Chan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED SAFETY DISCONNECTS FOR POWER SYSTEMS
- Publication number 20140313640
- Publication date Oct 23, 2014
- Bentek Corporation
- James PEPLINSKI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
INTEGRATED SAFETY DISCONNECTS FOR POWER SYSTEMS
- Publication number 20130050906
- Publication date Feb 28, 2013
- Jim Peplinski
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
POLISHING SYSTEM WITH IN-LINE AND IN-SITU METROLOGY
- Publication number 20110195528
- Publication date Aug 11, 2011
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Application
POLISHING SYSTEM WITH IN-LINE AND IN-SITU METROLOGY
- Publication number 20100062684
- Publication date Mar 11, 2010
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Application
METHODS AND APPARATUS FOR POLISHING CONTROL
- Publication number 20080268643
- Publication date Oct 30, 2008
- Applied Materials, Inc., a Delaware corporation
- Manoocher Birang
- B24 - GRINDING POLISHING
Information Patent Application
Polishing System With In-Line and In-Situ Metrology
- Publication number 20080064300
- Publication date Mar 13, 2008
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Application
Polishing System With In-Line and In-Situ Metrology
- Publication number 20060286904
- Publication date Dec 21, 2006
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Application
Methods and apparatus for polishing control
- Publication number 20060148261
- Publication date Jul 6, 2006
- Manoocher Birang
- B24 - GRINDING POLISHING
Information Patent Application
Polishing system with in-line and in-situ metrology
- Publication number 20050245170
- Publication date Nov 3, 2005
- Applied Materials, Inc., a Delaware corporation
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Application
Methods and apparatus for polishing control
- Publication number 20040166685
- Publication date Aug 26, 2004
- Manoocher Birang
- B24 - GRINDING POLISHING
Information Patent Application
OPTICAL MONITORING IN A TWO-STEP CHEMICAL MECHANICAL POLISHING PROCESS
- Publication number 20030104760
- Publication date Jun 5, 2003
- Applied Materials, Inc. a Delaware Corporation
- Bret W. Adams
- B24 - GRINDING POLISHING
Information Patent Application
OPTICAL MONITORING IN A TWO-STEP CHEMICAL MECHANICAL POLISHING PROCESS
- Publication number 20030003845
- Publication date Jan 2, 2003
- Bret W. Adams
- B24 - GRINDING POLISHING

David A. Chan

Person

Patents Grantslast 30 patents

Integrated safety disconnects for power systems

Integrated safety disconnects for power systems

Computer-implemented process control in chemical mechanical polishing

Polishing system with in-line and in-situ metrology

Computer-implemented method for process control in chemical mechani...

Methods and apparatus for polishing control

Polishing system with in-line and in-situ metrology

Polishing system with in-line and in-situ metrology

Methods and apparatus for polishing control

Polishing system with in-line and in-situ metrology

Optical monitoring in a two-step chemical mechanical polishing process

Optical monitoring in a two-step chemical mechanical polishing process

Apparatus and method for automated collimator exchange

Proximity detector for body contouring system of a medical camera

Patents Applicationslast 30 patents

INTEGRATED SAFETY DISCONNECTS FOR POWER SYSTEMS

INTEGRATED SAFETY DISCONNECTS FOR POWER SYSTEMS

POLISHING SYSTEM WITH IN-LINE AND IN-SITU METROLOGY

POLISHING SYSTEM WITH IN-LINE AND IN-SITU METROLOGY

METHODS AND APPARATUS FOR POLISHING CONTROL

Polishing System With In-Line and In-Situ Metrology

Polishing System With In-Line and In-Situ Metrology

Methods and apparatus for polishing control

Polishing system with in-line and in-situ metrology

Methods and apparatus for polishing control

OPTICAL MONITORING IN A TWO-STEP CHEMICAL MECHANICAL POLISHING PROCESS

OPTICAL MONITORING IN A TWO-STEP CHEMICAL MECHANICAL POLISHING PROCESS