David A. Crewe

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
High current density particle beam system
- Patent number 7,335,894
- Issue date Feb 26, 2008
- ICT Integrated Circuit Testing Gesselschaft
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample charging control in charged-particle systems
- Patent number 7,205,539
- Issue date Apr 17, 2007
- KLA-Tencor Technologies Corporation
- John Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Site stepping for electron beam micro analysis
- Patent number 7,115,866
- Issue date Oct 3, 2006
- KLA-Tencor Technologies, Inc.
- Roger Kroeze
- G01 - MEASURING TESTING