David A. Huppler

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Madison, WI, US

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Patents Grantslast 30 patents

Information Patent Grant
Standardizing between analytical instruments
- Patent number 6,138,082
- Issue date Oct 24, 2000
- The Perkin-Elmer Corporation
- Yongdong Wang
- G01 - MEASURING TESTING
Information Patent Grant
Standardizing a spectrometric instrument
- Patent number 6,049,762
- Issue date Apr 11, 2000
- Perkin Elmer LLC
- Alan M. Ganz
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing spectrometric data
- Patent number 6,029,115
- Issue date Feb 22, 2000
- Perkin Elmer LLC
- David H. Tracy
- G01 - MEASURING TESTING