Bethesda, MD, US
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Patent Grant
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
Jason John Gorman
G01 - MEASURING TESTING
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Patent Grant
The United States of America, as represented by the Secretary of Commerce
Adam J. Fleisher
G01 - MEASURING TESTING
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Patent Grant
The United States of America, as represented by the Secretary of Commerce
David F. Plusquellic
G02 - OPTICS
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Patent Grant
The United States of America, as represented by the Secretary of Commerce, NIST
David F. Plusquellic
G01 - MEASURING TESTING
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Patent Application
Government of the United States of America, as Represented by the Secretary o...
David Alexander Long
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Application
Government of the United States of America, as Represented by the Secretary o...
David Alexander Long
G01 - MEASURING TESTING
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Patent Application
Government of the United States of America, as Represented by the Secretary o...
Jason John Gorman
G01 - MEASURING TESTING
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Patent Application
Government of the United States of America, as Represented by the Secretary o...
Jason John Gorman
G01 - MEASURING TESTING
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Patent Application
Government of the United States of America, as Represented by the Secretary o...
ADAM J. FLEISHER
G01 - MEASURING TESTING
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Patent Application
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
DAVID F. PLUSQUELLIC
G02 - OPTICS
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Patent Application
David F. Plusquellic
G01 - MEASURING TESTING
