Membership
Tour
Register
Log in
David A. Norwood
Follow
Person
Richardson, TX, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Defect area consolidation for pattern inspector
Patent number
5,018,212
Issue date
May 21, 1991
Texas Instruments Incorporated
William G. Manns
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Guardbands for pattern inspector
Patent number
5,001,764
Issue date
Mar 19, 1991
Texas Instruments Incorporated
Anthony B. Wood
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Expansion of compact database for pattern inspector or writer
Patent number
4,989,255
Issue date
Jan 29, 1991
Texas Instruments Incorporated
William G. Manns
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of detecting and reviewing pattern defects
Patent number
4,985,927
Issue date
Jan 15, 1991
Texas Instruments Incorporated
David A. Norwood
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Parallel processing of reference and guardband data
Patent number
4,984,282
Issue date
Jan 8, 1991
Texas Instruments Incorporated
William G. Manns
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Data handling system for pattern inspector or writer
Patent number
4,979,223
Issue date
Dec 18, 1990
Texas Instruments Incorporated
William G. Manns
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Target autoalignment for pattern inspector or writer
Patent number
4,969,200
Issue date
Nov 6, 1990
Texas Instruments Incorporated
William G. Manns
G06 - COMPUTING CALCULATING COUNTING