David A. Wright

Person

Edinburgh, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Detection of subsurface resistivity contrasts with application to l...
- Patent number 6,914,433
- Issue date Jul 5, 2005
- The University Court of the University of Edinburgh
- David A Wright
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for correction of coordinate measurement er...
- Patent number 6,868,356
- Issue date Mar 15, 2005
- Renishaw plc
- Kenneth Cheng-Hoe Nai
- G01 - MEASURING TESTING
Information Patent Grant
Surface sensing device with optical sensor
- Patent number 6,633,051
- Issue date Oct 14, 2003
- Renishaw PLC
- Alan J Holloway
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating a scanning system
- Patent number 6,601,311
- Issue date Aug 5, 2003
- Renishaw PLC
- David R McMurtry
- G01 - MEASURING TESTING
Information Patent Grant
Calibrations of an analogue probe and error mapping
- Patent number 6,580,964
- Issue date Jun 17, 2003
- Renishaw PLC
- Alexander T Sutherland
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating a scanning system
- Patent number 6,434,846
- Issue date Aug 20, 2002
- Erenishaw PLC
- David R McMurtry
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Readhead for an opto-electronic rotary encoder
- Patent number 5,886,352
- Issue date Mar 23, 1999
- Reinshaw plc
- David A Wright
- G01 - MEASURING TESTING
Information Patent Grant
Bearings
- Patent number 5,374,125
- Issue date Dec 20, 1994
- Renishaw Metrology Limited
- David R. McMurtry
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Measuring probe
- Patent number 5,345,689
- Issue date Sep 13, 1994
- Renishaw Metrology Limited
- David R. McMurtry
- G01 - MEASURING TESTING
Information Patent Grant
Error determination for multi-axis apparatus due to thermal distortion
- Patent number 5,001,842
- Issue date Mar 26, 1991
- Ferranti International plc
- David A. Wright
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional position measuring apparatus
- Patent number 4,691,446
- Issue date Sep 8, 1987
- Ferranti plc
- Brian E. Pitches
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 4,625,408
- Issue date Dec 2, 1986
- Ferranti plc
- David A. Wright
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 4,523,380
- Issue date Jun 18, 1985
- David A. Wright
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Detection of subsurface resistivity contrasts with application to l...
- Publication number 20050237063
- Publication date Oct 27, 2005
- David A Wright
- G01 - MEASURING TESTING
Information Patent Application
Detection of subsurface resistivity contrasts with application to l...
- Publication number 20040232917
- Publication date Nov 25, 2004
- David A Wright
- G01 - MEASURING TESTING
Information Patent Application
Calibrations of an analogue probe and error mapping
- Publication number 20030009257
- Publication date Jan 9, 2003
- RENISHAW PLC
- Alexander T. Sutherland
- G01 - MEASURING TESTING
Information Patent Application
Method of calibrating a scanning system
- Publication number 20020174555
- Publication date Nov 28, 2002
- Renishaw PLC
- David R. McMurtry
- B82 - NANO-TECHNOLOGY

David A. Wright

Person

Patents Grantslast 30 patents

Detection of subsurface resistivity contrasts with application to l...

Method of and apparatus for correction of coordinate measurement er...

Surface sensing device with optical sensor

Method of calibrating a scanning system

Calibrations of an analogue probe and error mapping

Method of calibrating a scanning system

Readhead for an opto-electronic rotary encoder

Bearings

Measuring probe

Error determination for multi-axis apparatus due to thermal distortion

Three-dimensional position measuring apparatus

Measuring apparatus

Measuring apparatus

Patents Applicationslast 30 patents

Detection of subsurface resistivity contrasts with application to l...

Detection of subsurface resistivity contrasts with application to l...

Calibrations of an analogue probe and error mapping

Method of calibrating a scanning system