David Alan Shier

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Lee's Summit, MO, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for wire harness test results analysis
- Patent number 11,815,560
- Issue date Nov 14, 2023
- DIT-MCO INTERNATIONAL LLC
- David Alan Shier
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BINARY SCAN SYSTEM FOR LEAKAGE DETECTION IN WIRE HARNESSES
- Publication number 20250130291
- Publication date Apr 24, 2025
- DIT-MCO INTERNATIONAL LLC
- David Alan Shier
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR WIRE HARNESS TEST RESULTS ANALYSIS
- Publication number 20210247463
- Publication date Aug 12, 2021
- DIT-MCO INTERNATIONAL LLC
- David Alan Shier
- G01 - MEASURING TESTING