David Alumot

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Rehovt, IL

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Patents Grantslast 30 patents

Information Patent Grant
Optical inspection apparatus for substrate defect detection
- Patent number 7,796,807
- Issue date Sep 14, 2010
- Applied Materials, Israel Ltd.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection method for substrate defect detection
- Patent number 7,499,583
- Issue date Mar 3, 2009
- Applied Materials, Israel, Ltd.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection apparatus for substrate defect detection
- Patent number 6,952,491
- Issue date Oct 4, 2005
- Applied Materials, Inc.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection method and apparatus
- Patent number 6,178,257
- Issue date Jan 23, 2001
- Applied Materials, Inc.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection method and apparatus
- Patent number 5,982,921
- Issue date Nov 9, 1999
- Applied Materials, Inc.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Grant
Two-phase optical inspection method and apparatus for defect detection
- Patent number 5,699,447
- Issue date Dec 16, 1997
- Orbot Instruments Ltd.
- David Alumot
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INSPECTION APPARATUS FOR SUBSTRATE DEFECT DETECTION
- Publication number 20090148033
- Publication date Jun 11, 2009
- David Alumot
- G01 - MEASURING TESTING
Information Patent Application
Optical inspection apparatus for substrate defect detection
- Publication number 20040263834
- Publication date Dec 30, 2004
- Applied Materials, Inc.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Application
Optical inspection method for substrate defect detection
- Publication number 20040218807
- Publication date Nov 4, 2004
- Applied Materials, Inc.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Application
Optical inspection apparatus for defect detection
- Publication number 20020039436
- Publication date Apr 4, 2002
- David Alumot
- G01 - MEASURING TESTING