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David Awschalom
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Chicago, IL, US
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Patents Grants
last 30 patents
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Patent Grant
Electrometry by optical charge conversion of defects in the solid-s...
Patent number
12,174,225
Issue date
Dec 24, 2024
The University of Chicago
Gary Wolfowicz
G01 - MEASURING TESTING
Information
Patent Grant
Electrometry by optical charge conversion of defects in the solid-s...
Patent number
11,619,660
Issue date
Apr 4, 2023
The University of Chicago
Gary Wolfowicz
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor system with transitional metal impurity for quantum i...
Patent number
10,747,087
Issue date
Aug 18, 2020
The University of Chicago
David Awschalom
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Semiconductor system with transitional metal impurity for quantum i...
Patent number
10,372,015
Issue date
Aug 6, 2019
The University of Chicago
David Awschalom
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Electrometry by Optical Charge Conversion of Defects in the Solid-S...
Publication number
20230349957
Publication date
Nov 2, 2023
The University of Chicago
Gary Wolfowicz
G01 - MEASURING TESTING
Information
Patent Application
CHEMICALLY TUNABLE OPTICALLY ADDRESSABLE MOLECULR-SPIN QUBIT AND AS...
Publication number
20230153676
Publication date
May 18, 2023
The University of Chicago
Danna E. Freedman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Electrically Tunable Quantum Information Processing Device Based on...
Publication number
20220179284
Publication date
Jun 9, 2022
The University of Chicago
Alexandre Bourassa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods and Systems for Frequency Conversion and Modulation Using S...
Publication number
20220155621
Publication date
May 19, 2022
The University of Chicago
Kevin C. Miao
G02 - OPTICS
Information
Patent Application
Electrometry by Optical Charge Conversion of Defects in the Solid-S...
Publication number
20200400723
Publication date
Dec 24, 2020
The University of Chicago
Gary Wolfowicz
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR SYSTEM WITH TRANSITIONAL METAL IMPURITY FOR QUANTUM I...
Publication number
20200019038
Publication date
Jan 16, 2020
The University of Chicago
David Awschalom
G02 - OPTICS
Information
Patent Application
SEMICONDUCTOR SYSTEM WITH TRANSITIONAL METAL IMPURITY FOR QUANTUM I...
Publication number
20170261835
Publication date
Sep 14, 2017
The University of Chicago
William Koehl
B82 - NANO-TECHNOLOGY