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David B. Kay
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Rochester, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Partial coherence range sensor pen connected to the source/detector...
Patent number
11,118,897
Issue date
Sep 14, 2021
QUALITY VISION INTERNATIONAL INC.
David B. Kay
G01 - MEASURING TESTING
Information
Patent Grant
Exchangeable lens module system for probes of interferometric optic...
Patent number
10,444,003
Issue date
Oct 15, 2019
Quality Vision International, Inc.
David B. Kay
G02 - OPTICS
Information
Patent Grant
Exchangeable lens module system for probes of optical measuring mac...
Patent number
10,254,105
Issue date
Apr 9, 2019
Quality Vision International, Inc.
David B. Kay
G01 - MEASURING TESTING
Information
Patent Grant
Remote probe for optical measuring machine
Patent number
10,107,615
Issue date
Oct 23, 2018
Quality Vision International, Inc.
David B. Kay
G01 - MEASURING TESTING
Information
Patent Grant
Optical pen for interferometric measuring machine
Patent number
10,107,614
Issue date
Oct 23, 2018
Quality Vision International, Inc.
David B. Kay
G01 - MEASURING TESTING
Information
Patent Grant
Profilometer with partial coherence interferometer adapted for avoi...
Patent number
9,091,523
Issue date
Jul 28, 2015
Quality Vision International, Inc.
David B. Kay
G01 - MEASURING TESTING
Information
Patent Grant
Laser range sensor system optics adapter and method
Patent number
7,859,649
Issue date
Dec 28, 2010
Quality Vision International, Inc.
Eric G. Gesner
G01 - MEASURING TESTING
Information
Patent Grant
Dual resolution, dual range sensor system and method
Patent number
7,808,617
Issue date
Oct 5, 2010
Quality Vision International, Inc.
Eric G. Gesner
G01 - MEASURING TESTING
Information
Patent Grant
Partial coherence interferometer with measurement ambiguity resolution
Patent number
7,791,731
Issue date
Sep 7, 2010
Quality Vision International, Inc.
David B. Kay
G01 - MEASURING TESTING
Information
Patent Grant
Multi-element prism for optical heads
Patent number
5,793,719
Issue date
Aug 11, 1998
Eastman Kodak Company
Timothy S. Gardner
G11 - INFORMATION STORAGE
Information
Patent Grant
Multi-element prism for optical heads
Patent number
5,761,162
Issue date
Jun 2, 1998
Eastman Kodak Company
Ronald E. Gerber
G11 - INFORMATION STORAGE
Information
Patent Grant
Dual-wavelength optical recording head utilizing grating beam split...
Patent number
5,696,749
Issue date
Dec 9, 1997
Eastman Kodak Company
John C. Brazas
G11 - INFORMATION STORAGE
Information
Patent Grant
Read/write laser-detector-grating unit (LDGU) with an orthogonally-...
Patent number
5,544,143
Issue date
Aug 6, 1996
Eastman Kodak Company
David B. Kay
G11 - INFORMATION STORAGE
Information
Patent Grant
Single return path orthogonally-arranged optical focus and tracking...
Patent number
5,491,675
Issue date
Feb 13, 1996
Eastman Kodak Company
David B. Kay
G11 - INFORMATION STORAGE
Information
Patent Grant
Optical reproducing apparatus ultilizing a polarization beam splitter
Patent number
5,434,708
Issue date
Jul 18, 1995
Eastman Kodak Company
Mool C. Gupta
G02 - OPTICS
Information
Patent Grant
Apparatus and method for a dual half-aperture focus sensor system
Patent number
5,406,541
Issue date
Apr 11, 1995
Eastman Kodak Company
David B. Kay
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus and method for a single return path signal sensor system
Patent number
5,360,970
Issue date
Nov 1, 1994
Eastman Kodak Company
David B. Kay
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus and method for a modified half-aperture focus/tracking/da...
Patent number
5,353,272
Issue date
Oct 4, 1994
Eastman Kodak Company
Edward C. Gage
G11 - INFORMATION STORAGE
Information
Patent Grant
Hybrid refractive/diffractive achromatic lens for optical data stor...
Patent number
5,349,471
Issue date
Sep 20, 1994
The University of Rochester
G. Michael Morris
G02 - OPTICS
Information
Patent Grant
Optical scanning system with wavelength shift correction
Patent number
4,428,643
Issue date
Jan 31, 1984
Xerox Corporation
David B. Kay
G02 - OPTICS
Information
Patent Grant
Method of assembling a gradient index lens array having reduction p...
Patent number
4,405,207
Issue date
Sep 20, 1983
Xerox Corporation
David B. Kay
G02 - OPTICS
Information
Patent Grant
X'-, Y'-, Z'- axis multidimensional slit-scan flow system
Patent number
4,350,892
Issue date
Sep 21, 1982
Research Corporation
David B. Kay
G01 - MEASURING TESTING
Information
Patent Grant
Multiple function reproduction apparatus
Patent number
4,345,835
Issue date
Aug 24, 1982
Xerox Corporation
Charles J. Kramer
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Gradient index lens array having reduction properties
Patent number
4,331,380
Issue date
May 25, 1982
Xerox Corporation
James D. Rees
G02 - OPTICS
Information
Patent Grant
Multidimensional slit-scan flow system
Patent number
4,293,221
Issue date
Oct 6, 1981
Research Corporation
David B. Kay
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PARTIAL COHERENCE RANGE SENSOR PEN CONNECTED TO THE SOURCE/DETECTOR...
Publication number
20200240766
Publication date
Jul 30, 2020
Quality Vision International Inc.
David B. Kay
G01 - MEASURING TESTING
Information
Patent Application
EXCHANGEABLE LENS MODULE SYSTEM FOR PROBES OF OPTICAL MEASURING MAC...
Publication number
20190178626
Publication date
Jun 13, 2019
Quality Vision International, Inc.
David B. Kay
G02 - OPTICS
Information
Patent Application
OPTICAL PEN FOR INTERFEROMETRIC MEASURING MACHINE
Publication number
20180299250
Publication date
Oct 18, 2018
Quality Vision International, Inc.
David B. Kay
G01 - MEASURING TESTING
Information
Patent Application
EXCHANGEABLE LENS MODULE SYSTEM FOR PROBES OF OPTICAL MEASURING MAC...
Publication number
20180156595
Publication date
Jun 7, 2018
Quality Vision International, Inc.
David B. Kay
G02 - OPTICS
Information
Patent Application
REMOTE PROBE FOR OPTICAL MEASURING MACHINE
Publication number
20170307352
Publication date
Oct 26, 2017
Quality Vision International, Inc.
David B. Kay
G01 - MEASURING TESTING
Information
Patent Application
PROFILOMETER WITH PARTIAL COHERENCE INTERFEROMETER ADAPTED FOR AVOI...
Publication number
20150022817
Publication date
Jan 22, 2015
Quality Vision International, Inc.
David B. Kay
G01 - MEASURING TESTING
Information
Patent Application
PARTIAL COHERENCE INTERFEROMETER WITH MEASUREMENT AMBIGUITY RESOLUTION
Publication number
20090153839
Publication date
Jun 18, 2009
Quality Vision International, Inc.
David B. Kay
G01 - MEASURING TESTING
Information
Patent Application
DUAL RESOLUTION, DUAL RANGE SENSOR SYSTEM AND METHOD
Publication number
20090073419
Publication date
Mar 19, 2009
Quality Vision International, Inc.
Eric G. Gesner
G01 - MEASURING TESTING
Information
Patent Application
LASER RANGE SENSOR SYSTEM OPTICS ADAPTER AND METHOD
Publication number
20070258709
Publication date
Nov 8, 2007
Quality Vision International, Inc.
Eric G. Gesner
G01 - MEASURING TESTING