David B. Salzman

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New York, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for non-conductively interconnecting integrated circuits
- Patent number 7,869,221
- Issue date Jan 11, 2011
- Oracle America, Inc.
- Thomas F. Knight
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for non-conductively interconnecting integrate...
- Patent number 6,916,719
- Issue date Jul 12, 2005
- Thomas F. Knight
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for non-conductively interconnecting integrate...
- Patent number 6,728,113
- Issue date Apr 27, 2004
- Polychip, Inc.
- Thomas F. Knight
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for non-conductively interconnecting integrated circuits...
- Patent number 5,629,838
- Issue date May 13, 1997
- Polychip, Inc.
- Thomas F. Knight
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR NON-CONDUCTIVELY INTERCONNECTING INTEGRATE...
- Publication number 20080315978
- Publication date Dec 25, 2008
- SUN MICROSYSTEMS, INC.
- Thomas F. Knight
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for non-conductively interconnecting integrate...
- Publication number 20050002448
- Publication date Jan 6, 2005
- Polychip
- Thomas F. Knight
- G01 - MEASURING TESTING