David Bar-On

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Givat Ella, IL

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Patents Grantslast 30 patents

Information Patent Grant
Enhanced privacy for provision of computer vision
- Patent number 9,569,637
- Issue date Feb 14, 2017
- Intel Corporation
- David Bar-On
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhanced privacy for provision of computer vision
- Patent number 9,213,863
- Issue date Dec 15, 2015
- Intel Corporation
- David Bar-On
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhanced privacy for provision of computer vision
- Patent number 8,914,894
- Issue date Dec 16, 2014
- Intel Corporation
- David Bar-On
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Differential measurement of X-ray microfluorescence
- Patent number 6,453,002
- Issue date Sep 17, 2002
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Automatic cellular phone battery charging by mobile personal comput...
- Patent number 5,870,615
- Issue date Feb 9, 1999
- Intel Corporation
- David Bar-On
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
ENHANCED PRIVACY FOR PROVISION OF COMPUTER VISION
- Publication number 20160078249
- Publication date Mar 17, 2016
- Intel Corporation
- David Bar-On
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCED PRIVACY FOR PROVISION OF COMPUTER VISION
- Publication number 20150040242
- Publication date Feb 5, 2015
- Intel Corporation
- David Bar-On
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCED PRIVACY FOR PROVISION OF COMPUTER VISION
- Publication number 20140090074
- Publication date Mar 27, 2014
- Intel Corporation
- David Bar-On
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Two Dimensional Layout, High Noise Immunity, Interleaved Channels E...
- Publication number 20060176189
- Publication date Aug 10, 2006
- David Bar-On
- G01 - MEASURING TESTING
Information Patent Application
WAFER WITH OVERLAY TEST PATTERN
- Publication number 20030002620
- Publication date Jan 2, 2003
- Isaac Mazor
- G01 - MEASURING TESTING