David C. Grundy

Person

Chelmsford, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Durability enhanced and redundant embedded sensors
- Patent number 9,279,784
- Issue date Mar 8, 2016
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Internal material condition monitoring for control
- Patent number 8,981,018
- Issue date Mar 17, 2015
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G05 - CONTROLLING REGULATING
Information Patent Grant
Durability enhanced and redundant embedded sensors
- Patent number 8,803,515
- Issue date Aug 12, 2014
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Component adaptive life management
- Patent number 8,494,810
- Issue date Jul 23, 2013
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G07 - CHECKING-DEVICES
Information Patent Grant
Method for stress assessment that removes temperature effects and h...
- Patent number 8,415,947
- Issue date Apr 9, 2013
- Jentek Sensors, Inc.
- Yanko K. Sheiretov
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field characterization of stresses and properties in mater...
- Patent number 8,237,433
- Issue date Aug 7, 2012
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit with sense elements having associated and unassociated...
- Patent number 8,222,897
- Issue date Jul 17, 2012
- Jentek Sensors, Inc.
- Yanko K. Sheiretov
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field characterization of stresses and properties in mater...
- Patent number 7,876,094
- Issue date Jan 25, 2011
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Material condition assessment with eddy current sensors
- Patent number 7,812,601
- Issue date Oct 12, 2010
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Absolute property measurements using electromagnetic sensors
- Patent number 7,696,748
- Issue date Apr 13, 2010
- Jentek Sensors, Inc.
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Grant
Quasistatic magnetic and electric field stress/strain gages
- Patent number 7,533,575
- Issue date May 19, 2009
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Applied and residual stress measurements using magnetic field sensors
- Patent number 7,526,964
- Issue date May 5, 2009
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Fastener and fitting based sensing methods
- Patent number 7,528,598
- Issue date May 5, 2009
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid wound/etched winding constructs for scanning and monitoring
- Patent number 7,518,360
- Issue date Apr 14, 2009
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Material condition monitoring with multiple sensing modes
- Patent number 7,451,657
- Issue date Nov 18, 2008
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Segmented field dielectric sensor array for material characterization
- Patent number 7,280,940
- Issue date Oct 9, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Self-monitoring metals, alloys and materials
- Patent number 7,188,532
- Issue date Mar 13, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting a channel using a flexible sensor
- Patent number 7,183,764
- Issue date Feb 27, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Hidden feature characterization using a database of sensor responses
- Patent number 7,161,351
- Issue date Jan 9, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication of samples having predetermined material conditions
- Patent number 7,106,055
- Issue date Sep 12, 2006
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Process control and damage monitoring
- Patent number 7,095,224
- Issue date Aug 22, 2006
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit having parallel drive segments and a plurality of sens...
- Patent number 7,049,811
- Issue date May 23, 2006
- Jentek Sensors, Inc.
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Grant
High resolution inductive sensor arrays for material and defect cha...
- Patent number 6,995,557
- Issue date Feb 7, 2006
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current sensor arrays having drive windings with extended port...
- Patent number 6,784,662
- Issue date Aug 31, 2004
- Jentek Sensors, Inc.
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Grant
High resolution inductive sensor arrays for material and defect cha...
- Patent number 6,727,691
- Issue date Apr 27, 2004
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERNAL MATERIAL CONDITION MONITORING FOR CONTROL
- Publication number 20150160144
- Publication date Jun 11, 2015
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Durability Enhanced And Redundant Embedded Sensors
- Publication number 20150145510
- Publication date May 28, 2015
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Test Circuit With Sense Elements Having Associated And Unassociated...
- Publication number 20130014589
- Publication date Jan 17, 2013
- Yanko K. Sheiretov
- G01 - MEASURING TESTING
Information Patent Application
Performance Curve Generation For Non-Destructive Testing Sensors
- Publication number 20120271824
- Publication date Oct 25, 2012
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Durability Enhanced and Redundant Embedded Sensors
- Publication number 20110210724
- Publication date Sep 1, 2011
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Magnetic Field Characterization of Stresses and Properties in Mater...
- Publication number 20110163742
- Publication date Jul 7, 2011
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Component Adaptive Life Management
- Publication number 20110060568
- Publication date Mar 10, 2011
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G07 - CHECKING-DEVICES
Information Patent Application
Component Adaptive Life Management
- Publication number 20110054806
- Publication date Mar 3, 2011
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G07 - CHECKING-DEVICES
Information Patent Application
Magnetic field characterization of stresses and properties in mater...
- Publication number 20100045277
- Publication date Feb 25, 2010
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Material Condition Assessment with Eddy Current Sensors
- Publication number 20100026285
- Publication date Feb 4, 2010
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Torque and load monitoring using magnetic sensor arrays
- Publication number 20090001974
- Publication date Jan 1, 2009
- JENTEK Sensors, Inc.
- Yanko K. Sheiretov
- G01 - MEASURING TESTING
Information Patent Application
Hybrid wound/etched winding constructs for scanning and monitoring
- Publication number 20080258720
- Publication date Oct 23, 2008
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Quasistatic magnetic and electric field stress/strain gages
- Publication number 20070245834
- Publication date Oct 25, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Self-monitoring metals, alloys and materials
- Publication number 20070227255
- Publication date Oct 4, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Magnetic field characterization of stresses and properties in mater...
- Publication number 20070114993
- Publication date May 24, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Material characterization with model based sensors
- Publication number 20070069720
- Publication date Mar 29, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Test circuit with drive windings and sense elements
- Publication number 20070029997
- Publication date Feb 8, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Fastener and fitting based sensing methods
- Publication number 20070007955
- Publication date Jan 11, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Material condition assessment with eddy current sensors
- Publication number 20060244443
- Publication date Nov 2, 2006
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Segmented field dielectric sensor array for material characterization
- Publication number 20060247896
- Publication date Nov 2, 2006
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Automated drawing tool and method for drawing a sensor layout
- Publication number 20060186880
- Publication date Aug 24, 2006
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Application
Segmented field sensors
- Publication number 20060076952
- Publication date Apr 13, 2006
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Internal material condition monitoring for control
- Publication number 20060009865
- Publication date Jan 12, 2006
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G05 - CONTROLLING REGULATING
Information Patent Application
Segmented field sensors
- Publication number 20050248339
- Publication date Nov 10, 2005
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Material condition monitoring with multiple sensing modes
- Publication number 20050171703
- Publication date Aug 4, 2005
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Fabrication of samples having predetermined material conditions
- Publication number 20050146324
- Publication date Jul 7, 2005
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Absolute property measurements using electromagnetic sensors
- Publication number 20050127908
- Publication date Jun 16, 2005
- JENTEK Sensors, Inc.
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Application
Hidden feature characterization using eddy current sensors and arrays
- Publication number 20050088172
- Publication date Apr 28, 2005
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Self-monitoring metals, alloys and materials
- Publication number 20050083032
- Publication date Apr 21, 2005
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Weld characterization using eddy current sensors and arrays
- Publication number 20050017713
- Publication date Jan 27, 2005
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

David C. Grundy

Person

Patents Grantslast 30 patents

Durability enhanced and redundant embedded sensors

Internal material condition monitoring for control

Durability enhanced and redundant embedded sensors

Component adaptive life management

Method for stress assessment that removes temperature effects and h...

Magnetic field characterization of stresses and properties in mater...

Test circuit with sense elements having associated and unassociated...

Magnetic field characterization of stresses and properties in mater...

Material condition assessment with eddy current sensors

Absolute property measurements using electromagnetic sensors

Quasistatic magnetic and electric field stress/strain gages

Applied and residual stress measurements using magnetic field sensors

Fastener and fitting based sensing methods

Hybrid wound/etched winding constructs for scanning and monitoring

Material condition monitoring with multiple sensing modes

Segmented field dielectric sensor array for material characterization

Self-monitoring metals, alloys and materials

Method for inspecting a channel using a flexible sensor

Hidden feature characterization using a database of sensor responses

Fabrication of samples having predetermined material conditions

Process control and damage monitoring

Test circuit having parallel drive segments and a plurality of sens...

High resolution inductive sensor arrays for material and defect cha...

Eddy current sensor arrays having drive windings with extended port...

High resolution inductive sensor arrays for material and defect cha...

Patents Applicationslast 30 patents

INTERNAL MATERIAL CONDITION MONITORING FOR CONTROL

Durability Enhanced And Redundant Embedded Sensors

Test Circuit With Sense Elements Having Associated And Unassociated...

Performance Curve Generation For Non-Destructive Testing Sensors

Durability Enhanced and Redundant Embedded Sensors

Magnetic Field Characterization of Stresses and Properties in Mater...

Component Adaptive Life Management

Component Adaptive Life Management

Magnetic field characterization of stresses and properties in mater...

Material Condition Assessment with Eddy Current Sensors

Torque and load monitoring using magnetic sensor arrays

Hybrid wound/etched winding constructs for scanning and monitoring

Quasistatic magnetic and electric field stress/strain gages

Self-monitoring metals, alloys and materials

Magnetic field characterization of stresses and properties in mater...

Material characterization with model based sensors

Test circuit with drive windings and sense elements

Fastener and fitting based sensing methods

Material condition assessment with eddy current sensors

Segmented field dielectric sensor array for material characterization

Automated drawing tool and method for drawing a sensor layout

Segmented field sensors

Internal material condition monitoring for control

Segmented field sensors

Material condition monitoring with multiple sensing modes

Fabrication of samples having predetermined material conditions

Absolute property measurements using electromagnetic sensors

Hidden feature characterization using eddy current sensors and arrays

Self-monitoring metals, alloys and materials

Weld characterization using eddy current sensors and arrays