David C. HALSTEAD

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Cuba, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Sputtering system and method including an arc detection
- Patent number 10,607,821
- Issue date Mar 31, 2020
- MKS Insturments, Inc.
- Jesse N. Klein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sputtering system and method including an arc detection
- Patent number 9,613,784
- Issue date Apr 4, 2017
- MKS Instruments, Inc.
- Jesse N. Klein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting conditions in paralleled DC powe...
- Patent number 6,995,570
- Issue date Feb 7, 2006
- ENI Technology, Inc.
- David C. Halstead
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sputtering System And Method Including An Arc Detection
- Publication number 20170178879
- Publication date Jun 22, 2017
- MKS Instruments, Inc.
- Jesse N. KLEIN
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SPUTTERING SYSTEM AND METHOD INCLUDING AN ARC DETECTION
- Publication number 20100012482
- Publication date Jan 21, 2010
- MKS Instruments, Inc.
- Jesse N. Klein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for detecting conditions in paralleled DC powe...
- Publication number 20040000916
- Publication date Jan 1, 2004
- David C. Halstead
- G01 - MEASURING TESTING