David C. Neckels

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Berthoud, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
System and methods for semi-automated editing of orthomosaics built...
- Patent number 10,474,895
- Issue date Nov 12, 2019
- DigitalGlobe, Inc.
- Matthew Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and methods for semi-automated editing of ortho-mosaics buil...
- Patent number 10,121,074
- Issue date Nov 6, 2018
- DigitalGlobe, Inc.
- Matthew Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and methods for semi-automated editing of ortho-mosaics buil...
- Patent number 9,600,740
- Issue date Mar 21, 2017
- DigitalGlobe, Inc.
- Matthew Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Calculate drop delay for flow cytometry systems and methods
- Patent number 8,922,646
- Issue date Dec 30, 2014
- Beckman Coulter, Inc.
- David Neckels
- G01 - MEASURING TESTING
Information Patent Grant
Generating pulse parameters in a particle analyzer
- Patent number 8,754,390
- Issue date Jun 17, 2014
- Beckman Coulter, Inc.
- Christopher D. Lofstrom
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHODS FOR SEMI-AUTOMATED EDITING OF ORTHOMOSAICS BUILT...
- Publication number 20190180102
- Publication date Jun 13, 2019
- DIGITALGLOBE, INC.
- Matthew Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHODS FOR SEMI-AUTOMATED EDITING OF ORTHO-MOSAICS BUIL...
- Publication number 20170300749
- Publication date Oct 19, 2017
- DIGITALGLOBE, INC.
- Matthew Tang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODS FOR SEMI-AUTOMATED EDITING OF ORTHO-MOSAICS BUIL...
- Publication number 20150339530
- Publication date Nov 26, 2015
- DIGITALGLOBE, INC.
- David Neckels
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Generating Pulse Parameters in a Particle Analyzer
- Publication number 20110303859
- Publication date Dec 15, 2011
- Christopher D. Lofstrom
- G01 - MEASURING TESTING
Information Patent Application
Calculate Drop Delay for Flow Cytometry Systems and Methods
- Publication number 20110221892
- Publication date Sep 15, 2011
- David C. Neckels
- G01 - MEASURING TESTING