David C. Newbury

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Saratoga, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Test structure and method for failure analysis of small contacts in...
- Patent number 7,135,879
- Issue date Nov 14, 2006
- Advanced Micro Devices, Inc.
- David C. Newbury
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level global bitmap characterization in integrated circuit te...
- Patent number 7,137,085
- Issue date Nov 14, 2006
- Advanced Micro Devices, Inc.
- John J. Wang
- G01 - MEASURING TESTING