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David C. Sowell
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Atlanta, GA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Wafer inspection system
Patent number
7,308,367
Issue date
Dec 11, 2007
Qcept Technologies, Inc.
M. Brandon Steele
G01 - MEASURING TESTING
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Patent Grant
Inspection system and apparatus
Patent number
7,103,482
Issue date
Sep 5, 2006
Qcept Technologies, Inc.
M. Brandon Steele
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
INSPECTION SYSTEM AND APPARATUS
Publication number
20050059174
Publication date
Mar 17, 2005
M. Brandon Steele
G01 - MEASURING TESTING
Information
Patent Application
Wafer inspection system
Publication number
20040241890
Publication date
Dec 2, 2004
QCEPT TECHNOLOGIES, INC.
M. Brandon Steele
G01 - MEASURING TESTING