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David Cecil Hays
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Gainesville, FL, US
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Patents Grants
last 30 patents
Information
Patent Grant
High voltage switch and method of making
Patent number
8,054,147
Issue date
Nov 8, 2011
General Electric Company
David Cecil Hays
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrical connection through a substrate to a microelectromechanic...
Patent number
7,915,696
Issue date
Mar 29, 2011
General Electric Company
David Cecil Hays
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Irregularly shaped actuator fingers for a micro-electromechanical s...
Patent number
7,796,269
Issue date
Sep 14, 2010
Morpho Detection, Inc.
Anis Zribi
G01 - MEASURING TESTING
Information
Patent Grant
Piezoelectric composite apparatus and related methods
Patent number
7,696,676
Issue date
Apr 13, 2010
Lockheed Martin Corporation
Ertugrul Berkcan
G01 - MEASURING TESTING
Information
Patent Grant
System and method for optical power management
Patent number
7,692,785
Issue date
Apr 6, 2010
General Electric Company
Willam Scott Sutherland
G01 - MEASURING TESTING
Information
Patent Grant
Sealed wafer packaging of microelectromechanical systems
Patent number
7,605,466
Issue date
Oct 20, 2009
General Electric Company
Marco Francesco Aimi
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Micro-electromechanical system Fabry-Perot filter mirrors
Patent number
7,573,578
Issue date
Aug 11, 2009
GE Homeland Protection, Inc.
Anis Zribi
G02 - OPTICS
Information
Patent Grant
Actuator for micro-electromechanical system fabry-perot filter
Patent number
7,551,287
Issue date
Jun 23, 2009
GE Homeland Protection, Inc.
Anis Zribi
A45 - HAND OR TRAVELLING ARTICLES
Information
Patent Grant
Compact, hand-held raman spectrometer microsystem on a chip
Patent number
7,505,128
Issue date
Mar 17, 2009
General Electric Company
Anis Zribi
G01 - MEASURING TESTING
Information
Patent Grant
Collection probe for use in a Raman spectrometer system and methods...
Patent number
7,411,670
Issue date
Aug 12, 2008
GE Homeland Protection, Inc.
Anis Zribi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL DETECTION SYSTEM
Publication number
20110075142
Publication date
Mar 31, 2011
GENERAL ELECTRIC COMPANY
Sandip Maity
G02 - OPTICS
Information
Patent Application
HIGH VOLTAGE SWITCH AND METHOD OF MAKING
Publication number
20100252403
Publication date
Oct 7, 2010
GENERAL ELECTRIC COMPANY
David Cecil Hays
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Micro-electromechanical system fabry-perot filter cavity
Publication number
20100220331
Publication date
Sep 2, 2010
Anis Zribi
G02 - OPTICS
Information
Patent Application
IRREGULARLY SHAPED ACTUATOR FINGERS FOR A MICRO-ELECTROMECHANICAL S...
Publication number
20100182608
Publication date
Jul 22, 2010
Anis Zribi
G02 - OPTICS
Information
Patent Application
ELECTRICAL CONNECTION THROUGH A SUBSTRATE TO A MICROELECTROMECHANIC...
Publication number
20090107812
Publication date
Apr 30, 2009
David Cecil Hays
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SEALED WAFER PACKAGING OF MICROELECTROMECHANICAL SYSTEMS
Publication number
20090096088
Publication date
Apr 16, 2009
MARCO FRANCESCO AIMI
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SYSTEM AND METHOD FOR OPTICAL POWER MANAGEMENT
Publication number
20080239306
Publication date
Oct 2, 2008
GENERAL ELECTRIC COMPANY
William Scott Sutherland
G02 - OPTICS
Information
Patent Application
INTERFEROMETER AND METHOD FOR FABRICATING SAME
Publication number
20080158568
Publication date
Jul 3, 2008
GENERAL ELECTRIC COMPANY
Glenn Scott Claydon
G01 - MEASURING TESTING
Information
Patent Application
Piezoelectric composite apparatus and related methods
Publication number
20080143216
Publication date
Jun 19, 2008
Lockheed Martin Corporation
Ertugrul Berkcan
G01 - MEASURING TESTING
Information
Patent Application
Compact, hand-held Raman spectrometer microsystem on a chip
Publication number
20070236697
Publication date
Oct 11, 2007
Anis Zribi
G01 - MEASURING TESTING
Information
Patent Application
Collection probe for use in a Raman spectrometer system and methods...
Publication number
20070127019
Publication date
Jun 7, 2007
Anis Zribi
G01 - MEASURING TESTING